Basic Concepts of Measurement


Book Description

The nature of measurement is a topic of central concern in the philosophy of science and, indeed, measurement is the essential link between science and mathematics. Professor Ellis's book, originally published in 1966, is the first general exposition of the philosophical and logical principles involved in measurement since N. R. Campbell's Principles of Measurement and Calculation (1928), and P. W. Bridgman's Dimensional Analysis (1931). Professor Ellis writes from an empiricist standpoint. His object is to distinguish and define the basic concepts in measurement, for example: scale, quantity, unit. dimension, number and probability. He discusses the problem of classifying scales of measurement and the special logical problems associated with each kind of scale. A translation of mach's Critique on the Concept of Temperature, which gives his views on the nature of measurement more fully than in any of his other works, is given as an appendix.




Statistics in a Nutshell


Book Description

A clear and concise introduction and reference for anyone new to the subject of statistics.







Social Science Concepts and Measurement


Book Description

Revised edition of the author's Social science concepts, c2006.




Measurement and Instrumentation in Engineering


Book Description

Presenting a mathematical basis for obtaining valid data, and basic concepts inmeasurement and instrumentation, this authoritative text is ideal for a one-semesterconcurrent or independent lecture/laboratory course.Strengthening students' grasp of the fundamentals with the most thorough, in-depthtreatment available, Measurement and Instrumentation in Engineeringdiscusses in detail basic methods of measurement, interaction between a transducer andits environment, arrangement of components in a system, and system dynamics ...describes current engineering practice and applications in terms of principles andphysical laws .. . enables students to identify and document the sources of noise andloading . .. furnishes basic laboratory experiments in sufficient detail to minimizeinstructional time ... and features more than 850 display equations, over 625 figures,and end-of-chapter problems.This impressive text, written by masters in the field, is the outstanding choice forupper-level undergraduate and beginning graduate-level courses in engineeringmeasurement and instrumentation in universities and four-year technical institutes formost departments.




Introduction to Statistics in Metrology


Book Description

This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.




How to Measure Anything


Book Description

Now updated with new research and even more intuitive explanations, a demystifying explanation of how managers can inform themselves to make less risky, more profitable business decisions This insightful and eloquent book will show you how to measure those things in your own business that, until now, you may have considered "immeasurable," including customer satisfaction, organizational flexibility, technology risk, and technology ROI. Adds even more intuitive explanations of powerful measurement methods and shows how they can be applied to areas such as risk management and customer satisfaction Continues to boldly assert that any perception of "immeasurability" is based on certain popular misconceptions about measurement and measurement methods Shows the common reasoning for calling something immeasurable, and sets out to correct those ideas Offers practical methods for measuring a variety of "intangibles" Adds recent research, especially in regards to methods that seem like measurement, but are in fact a kind of "placebo effect" for management – and explains how to tell effective methods from management mythology Written by recognized expert Douglas Hubbard-creator of Applied Information Economics-How to Measure Anything, Second Edition illustrates how the author has used his approach across various industries and how any problem, no matter how difficult, ill defined, or uncertain can lend itself to measurement using proven methods.




Measurement Science for Engineers


Book Description

This volume, from an international authority on the subject, deals with the physical and instrumentation aspects of measurement science, the availability of major measurement tools, and how to use them. This book not only lays out basic concepts of electronic measurement systems, but also provides numerous examples and exercises for the student.·Ideal for courses on instrumentation, control engineering and physics ·Numerous worked examples and student exercises







Principles of Measurement Systems


Book Description

Covers techniques and theory in the field, for students in degree courses for instrumentation/control, mechanical manufacturing, engineering, and applied physics. Three sections discuss system performance under static and dynamic conditions, principles of signal conditioning and data presentation, and applications. This third edition incorporates recent developments in computing, solid-state electronics, and optoelectronics. Includes problems and bandw diagrams. Annotation copyright by Book News, Inc., Portland, OR