Author : Srivathsan Krishnamohan
Publisher :
Page : 282 pages
File Size : 30,53 MB
Release : 2005
Category : Logic circuits
ISBN :
Author : Salah S. Al-Majeed
Publisher : Springer Science & Business Media
Page : 329 pages
File Size : 17,57 MB
Release : 2011-05-10
Category : Computers
ISBN : 3642211526
This book constitutes the refereed proceedings of the Third International Conference on Wireless, Mobile Networks and Applications, WiMoA 2011, and the First International Conference on Computer Science, Engineering and Applications, ICCSEA 2011, held in Dubai, United Arab Emirates, in May 2011. The book is organized as a collection of papers from WiMoA 2011 and ICCSEA 2011. The 8 revised full papers presented in the WiMoA 2011 part were carefully reviewed and selected from 63 submissions. The 20 revised full papers presented in the ICCSEA 2011 part were carefully reviewed and selected from 110 submissions.
Author :
Publisher :
Page : 862 pages
File Size : 14,28 MB
Release : 2006
Category : Dissertations, Academic
ISBN :
Author : Tomasz Wojcicki
Publisher : CRC Press
Page : 486 pages
File Size : 36,15 MB
Release : 2017-12-19
Category : Technology & Engineering
ISBN : 1466599103
Recently the world celebrated the 60th anniversary of the invention of the first transistor. The first integrated circuit (IC) was built a decade later, with the first microprocessor designed in the early 1970s. Today, ICs are a part of nearly every aspect of our daily lives. They help us live longer and more comfortably, and do more, faster. All this is possible because of the relentless search for new materials, circuit designs, and ideas happening on a daily basis at industrial and academic institutions around the globe. Showcasing the latest advances in very-large-scale integrated (VLSI) circuits, VLSI: Circuits for Emerging Applications provides a balanced view of industrial and academic developments beyond silicon and complementary metal–oxide–semiconductor (CMOS) technology. From quantum-dot cellular automata (QCA) to chips for cochlear implants, this must-have resource: Investigates the trend of combining multiple cores in a single chip to boost performance of the overall system Describes a novel approach to enable physically unclonable functions (PUFs) using intrinsic features of a VLSI chip Examines the VLSI implementations of major symmetric and asymmetric key cryptographic algorithms, hash functions, and digital signatures Discusses nonvolatile memories such as resistive random-access memory (Re-RAM), magneto-resistive RAM (MRAM), and floating-body RAM (FB-RAM) Explores organic transistors, soft errors, photonics, nanoelectromechanical (NEM) relays, reversible computation, bioinformatics, asynchronous logic, and more VLSI: Circuits for Emerging Applications presents cutting-edge research, design architectures, materials, and uses for VLSI circuits, offering valuable insight into the current state of the art of micro- and nanoelectronics.
Author : Olga Goloubeva
Publisher : Springer Science & Business Media
Page : 238 pages
File Size : 43,24 MB
Release : 2006-09-19
Category : Technology & Engineering
ISBN : 0387329374
This book presents the theory behind software-implemented hardware fault tolerance, as well as the practical aspects needed to put it to work on real examples. By evaluating accurately the advantages and disadvantages of the already available approaches, the book provides a guide to developers willing to adopt software-implemented hardware fault tolerance in their applications. Moreover, the book identifies open issues for researchers willing to improve the already available techniques.
Author : Jaume Segura
Publisher : John Wiley & Sons
Page : 370 pages
File Size : 50,34 MB
Release : 2004-03-26
Category : Technology & Engineering
ISBN : 9780471476696
CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.
Author : Rajesh Garg
Publisher : Springer
Page : 0 pages
File Size : 33,48 MB
Release : 2010-04-29
Category : Technology & Engineering
ISBN : 9781441909329
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Author : Jörg Henkel
Publisher : Springer Nature
Page : 606 pages
File Size : 48,58 MB
Release : 2020-12-09
Category : Technology & Engineering
ISBN : 303052017X
This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
Author : G.C. Messenger
Publisher : Springer Science & Business Media
Page : 367 pages
File Size : 32,27 MB
Release : 2013-11-27
Category : Technology & Engineering
ISBN : 1461560438
This monograph is written for neophytes, students, and practitioners to aid in their understanding of single event phenomena. It attempts to collect the highlights as well as many of the more detailed aspects of this field into an entity that portrays the theoretical as well as the practical applications of this subject. Those who claim that "theory" is not for them can skip over the earlier chapters dealing with the fundamental and theoretical portions and find what they need in the way of hands-on guidelines and pertinent formulas in the later chapters. Perhaps, after a time they will return to peruse the earlier chapters for a more complete rendition and appreciation of the subject matter. It is felt that the reader should have some acquaintance with the electronics of semiconductors and devices, some broad atomic physics introduction, as well as a respectable level of mathematics through calculus, including simple differential equations. A large part of the preceding can be obtained informally, through job experience, self-study, evening classes, as well as from a formal college curriculum.
Author : Michael Hübner
Publisher : Springer
Page : 105 pages
File Size : 42,92 MB
Release : 2015-11-14
Category : Technology & Engineering
ISBN : 3319233890
This book explores near-threshold computing (NTC), a design-space using techniques to run digital chips (processors) near the lowest possible voltage. Readers will be enabled with specific techniques to design chips that are extremely robust; tolerating variability and resilient against errors. Variability-aware voltage and frequency allocation schemes will be presented that will provide performance guarantees, when moving toward near-threshold manycore chips. · Provides an introduction to near-threshold computing, enabling reader with a variety of tools to face the challenges of the power/utilization wall; · Demonstrates how to design efficient voltage regulation, so that each region of the chip can operate at the most efficient voltage and frequency point; · Investigates how performance guarantees can be ensured when moving towards NTC manycores through variability-aware voltage and frequency allocation schemes.
