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Kelvin Probe Force Microscopy

Author : Sascha Sadewasser

Publisher : Springer Science & Business Media

Page : 334 pages

File Size : 17,89 MB

Release : 2011-10-22

Category : Technology & Engineering

ISBN : 3642225667

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Book Description

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.



Kelvin Probe Force Microscopy

Author : Sascha Sadewasser

Publisher : Springer

Page : 530 pages

File Size : 50,12 MB

Release : 2018-03-09

Category : Science

ISBN : 3319756877

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Book Description

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.



Surface Science Tools for Nanomaterials Characterization

Author : Challa S.S.R. Kumar

Publisher : Springer

Page : 653 pages

File Size : 29,9 MB

Release : 2015-03-10

Category : Science

ISBN : 3662445514

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Book Description

Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.



Conductive Atomic Force Microscopy

Author : Mario Lanza

Publisher : John Wiley & Sons

Page : 382 pages

File Size : 36,45 MB

Release : 2017-12-04

Category : Science

ISBN : 3527340912

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Book Description

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.



Correlative Imaging

Author : Paul Verkade

Publisher : John Wiley & Sons

Page : 245 pages

File Size : 47,78 MB

Release : 2019-11-04

Category : Science

ISBN : 1119086450

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Book Description

Brings a fresh point of view to the current state of correlative imaging and the future of the field This book provides contributions from international experts on correlative imaging, describing their vision of future developments in the field based on where it is today. Starting with a brief historical overview of how the field evolved, it presents the latest developments in microscopy that facilitate the correlative workflow. It also discusses the need for an ideal correlative probe, applications in proteomic and elemental analysis, interpretation methods, and how correlative imaging can incorporate force microscopy, soft x-ray tomography, and volume electron microscopy techniques. Work on placing individual molecules within cells is also featured. Correlative Imaging: Focusing on the Future offers in-depth chapters on: correlative imaging from an LM perspective; the importance of sample processing for correlative imaging; correlative light and volume EM; correlation with scanning probe microscopies; and integrated microscopy. It looks at: cryo-correlative microscopy; correlative cryo soft X-ray imaging; and array tomography. Hydrated-state correlative imaging in vacuo, correlating data from different imaging modalities, and big data in correlative imaging are also considered. Brings a fresh view to one of the hottest topics within the imaging community: the correlative imaging field Discusses current research and offers expert thoughts on the field’s future developments Presented by internationally-recognized editors and contributors with extensive experience in research and applications Of interest to scientists working in the fields of imaging, structural biology, cell biology, developmental biology, neurobiology, cancer biology, infection and immunity, biomaterials and biomedicine Part of the Wiley–Royal Microscopical Society series Correlative Imaging: Focusing on the Future will appeal to those working in the expanding field of the biosciences, correlative microscopy and related microscopic areas. It will also benefit graduate students working in microscopy, as well as anyone working in the microscopy imaging field in biomedical research.



Exploring Scanning Probe Microscopy with MATHEMATICA

Author : Dror Sarid

Publisher : John Wiley & Sons

Page : 310 pages

File Size : 35,3 MB

Release : 2007-02-27

Category : Science

ISBN : 3527609873

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Book Description

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.



Atomic Force Microscopy

Author : Bert Voigtländer

Publisher : Springer

Page : 329 pages

File Size : 10,75 MB

Release : 2019-05-23

Category : Science

ISBN : 303013654X

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Book Description

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.



Scanning Probe Microscopy

Author : Sergei V. Kalinin

Publisher : Springer Science & Business Media

Page : 1002 pages

File Size : 12,84 MB

Release : 2007-04-03

Category : Technology & Engineering

ISBN : 0387286683

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Book Description

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.



Scanning Probe Microscopy

Author : Bert Voigtländer

Publisher : Springer

Page : 375 pages

File Size : 13,16 MB

Release : 2015-02-24

Category : Technology & Engineering

ISBN : 3662452405

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Book Description

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.



Hybrid Organic-Inorganic Interfaces

Author : Marie Helene Delville

Publisher : John Wiley & Sons

Page : 1010 pages

File Size : 12,95 MB

Release : 2018-04-09

Category : Technology & Engineering

ISBN : 3527342559

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Book Description

Das erste Handbuch und gut zugängliche Referenzwerk zu diesem zunehmend wichtigen Thema erläutert in einem anwendungsorientierten Ansatz Synthese, Design, Charakterisierung und Simulation von Grenzflächen bei hybriden organisch-anorganischen Materialien.