Multilayer and Grazing Incidence X-ray/EUV Optics
Author :
Publisher :
Page : 370 pages
File Size : 45,44 MB
Release : 1996
Category : Grazing incidence
ISBN :
Multilayer and Grazing Incidence X-ray
Author : Richard B. Hoover
Publisher :
Page : pages
File Size : 34,95 MB
Release : 1996
Category :
ISBN : 9780819421937
Book Description
Multilayer and Grazing Incidence X-Ray/EUV Optics III
Author :
Publisher :
Page : pages
File Size : 12,73 MB
Release : 1996
Category :
ISBN :
Book Description
Handbook of X-ray and Gamma-ray Astrophysics
Author : Cosimo Bambi
Publisher : Springer Nature
Page : 5912 pages
File Size : 21,20 MB
Release :
Category :
ISBN : 9811969604
Book Description
National Semiconductor Metrology Program
Author : National Semiconductor Metrology Program (U.S.)
Publisher :
Page : 120 pages
File Size : 34,50 MB
Release :
Category : Semiconductors
ISBN :
Book Description
National Semiconductor Metrology Program
Author : National Institute of Standards and Technology (U.S.)
Publisher :
Page : 160 pages
File Size : 42,22 MB
Release : 2000
Category : Semiconductors
ISBN :
Book Description
Multilayer and Grazing Incidence X-ray/EUV Optics II
Author : Richard B. Hoover
Publisher : Society of Photo Optical
Page : 592 pages
File Size : 15,62 MB
Release : 1994
Category : Technology & Engineering
ISBN : 9780819412607
Book Description
Modern Developments in X-Ray and Neutron Optics
Author : Alexei Erko
Publisher : Springer
Page : 541 pages
File Size : 39,35 MB
Release : 2008-04-01
Category : Science
ISBN : 3540745610
Book Description
This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the x-ray and neutron optical systems. It is based on the joint research activities of specialists in x-ray and neutron optics, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002-2006.
X-ray and Ultraviolet Sensors and Applications
Author : Richard B. Hoover
Publisher :
Page : 240 pages
File Size : 18,1 MB
Release : 1995
Category : Science
ISBN :
Book Description
National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Author :
Publisher :
Page : 160 pages
File Size : 28,92 MB
Release : 2000
Category :
ISBN :
