National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
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Page : 160 pages
File Size : 44,98 MB
Release : 2000
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Author :
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Page : 160 pages
File Size : 44,98 MB
Release : 2000
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Author : National Institute of Standards and Technology (U.S.)
Publisher :
Page : 160 pages
File Size : 16,3 MB
Release : 2000
Category : Semiconductors
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Author : National Semiconductor Metrology Program (U.S.)
Publisher :
Page : 160 pages
File Size : 34,63 MB
Release : 2000
Category : Semiconductors
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Page : 148 pages
File Size : 26,95 MB
Release : 1999
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Page : 1328 pages
File Size : 42,90 MB
Release : 2003
Category : Government publications
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Author : Barry N. Taylor
Publisher : DIANE Publishing
Page : 25 pages
File Size : 16,91 MB
Release : 2009-11
Category : Science
ISBN : 1437915566
Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.
Author : D. K. Harman
Publisher : DIANE Publishing
Page : 527 pages
File Size : 50,36 MB
Release : 1995-10
Category :
ISBN : 0788125214
Held in Gaithersburg, MD, Nov. 4-6, 1992. Evaluates new technologies in information retrieval. Numerous graphs, tables and charts.
Author : Barry Taylor
Publisher : DIANE Publishing
Page : 84 pages
File Size : 45,8 MB
Release : 1995-11
Category : Metric system
ISBN : 0788125796
A basic introduction to the metric system. Covers: the three classes of SI units & the SI prefixes; units outside the SI; rules & style conventions for printing & using units; rules & style conventions for expressing values of quantities; comments on some quantities & their units; rules & style conventions for spelling unit names; printing & using symbols & numbers in scientific & technical documents; & check list for reviewing manuscripts. Appendix: definitions of SI base units & the radian & Steradian; conversion factors, & comments on the references of the SI for the U.S. Extensive bibliography.
Author : International Union of Pure and Applied Chemistry. Physical and Biophysical Chemistry Division
Publisher : Royal Society of Chemistry
Page : 240 pages
File Size : 13,27 MB
Release : 2007
Category : Reference
ISBN : 0854044337
Prepared by the IUPAC Physical Chemistry Division this definitive manual, now in its third edition, is designed to improve the exchange of scientific information among the readers in different disciplines and across different nations. This book has been systematically brought up to date and new sections added to reflect the increasing volume of scientific literature and terminology and expressions being used. The Third Edition reflects the experience of the contributors with the previous editions and the comments and feedback have been integrated into this essential resource. This edition has been compiled in machine-readable form and will be available online.
Author : Mary Jo DiBernardo
Publisher :
Page : 0 pages
File Size : 34,60 MB
Release : 2002
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