On-Chip Instrumentation


Book Description

This book provides an in-depth overview of on chip instrumentation technologies and various approaches taken in adding instrumentation to System on Chip (ASIC, ASSP, FPGA, etc.) design that are collectively becoming known as Design for Debug (DfD). On chip instruments are hardware based blocks that are added to a design for the specific purpose and improving the visibility of internal or embedded portions of the design (specific instruction flow in a processor, bus transaction in an on chip bus as examples) to improve the analysis or optimization capabilities for a SoC. DfD is the methodology and infrastructure that surrounds the instrumentation. Coverage includes specific design examples and discussion of implementations and DfD tradeoffs in a decision to design or select instrumentation or SoC that include instrumentation. Although the focus will be on hardware implementations, software and tools will be discussed in some detail.




Noise Coupling in System-on-Chip


Book Description

Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book discusses a breakthrough substrate coupling analysis flow and modelling toolset, addressing the needs of the design community. The flow provides capability to analyze noise components, propagating through the substrate, the parasitic interconnects and the package. Using this book, the reader can analyze and avoid complex noise coupling that degrades RF and mixed signal design performance, while reducing the need for conservative design practices. With chapters written by leading international experts in the field, novel methodologies are provided to identify noise coupling in silicon. It additionally features case studies that can be found in any modern CMOS SoC product for mobile communications, automotive applications and readout front ends.




Debugging Systems-on-Chip


Book Description

This book describes an approach and supporting infrastructure to facilitate debugging the silicon implementation of a System-on-Chip (SOC), allowing its associated product to be introduced into the market more quickly. Readers learn step-by-step the key requirements for debugging a modern, silicon SOC implementation, nine factors that complicate this debugging task, and a new debug approach that addresses these requirements and complicating factors. The authors’ novel communication-centric, scan-based, abstraction-based, run/stop-based (CSAR) debug approach is discussed in detail, showing how it helps to meet debug requirements and address the nine, previously identified factors that complicate debugging silicon implementations of SOCs. The authors also derive the debug infrastructure requirements to support debugging of a silicon implementation of an SOC with their CSAR debug approach. This debug infrastructure consists of a generic on-chip debug architecture, a configurable automated design-for-debug flow to be used during the design of an SOC, and customizable off-chip debugger software. Coverage includes an evaluation of the efficiency and effectiveness of the CSAR approach and its supporting infrastructure, using six industrial SOCs and an illustrative, example SOC model. The authors also quantify the hardware cost and design effort to support their approach.




Real World Multicore Embedded Systems


Book Description

This Expert Guide gives you the techniques and technologies in embedded multicore to optimally design and implement your embedded system. Written by experts with a solutions focus, this encyclopedic reference gives you an indispensable aid to tackling the day-to-day problems when building and managing multicore embedded systems. Following an embedded system design path from start to finish, our team of experts takes you from architecture, through hardware implementation to software programming and debug. With this book you will learn: • What motivates multicore • The architectural options and tradeoffs; when to use what • How to deal with the unique hardware challenges that multicore presents • How to manage the software infrastructure in a multicore environment • How to write effective multicore programs • How to port legacy code into a multicore system and partition legacy software • How to optimize both the system and software • The particular challenges of debugging multicore hardware and software - Examples demonstrating timeless implementation details - Proven and practical techniques reflecting the authors' expertise built from years of experience and key advice on tackling critical issues




Real World Multicore Embedded Systems


Book Description

As in any complex architecture, debug and instrumentation resources are critical for multicore design. Debug instrumentation provides information for post-silicon debug analysis, software optimization, and performance monitoring. In this chapter, we introduce debug concepts useful for multicore; we deconstruct and discuss different debug instrumentation blocks and interfaces, including typical operations and system integration; and we discuss differences, considerations, and approaches more appropriate to multicore debug. This is followed by multicore debug examples, some of which are based on open standards and some on commercially-available blocks from processor IP providers.




Electrical Instrumentation and Process Control (For UPTU, Lucknow)


Book Description

This book is written in a simple and easy-to-understand language to explain the fundamental concepts of the subject. The book presents the subject of EIPC in a comprehensive manner to the students at undergraduate level.This book not only covers the entire scope of the subject but also explains the philosophy of the subject. This makes the understanding of the subject more clear and interesting. The book will be very useful not only to the students but also to the faculty members.




VLSI-SoC: Technology Advancement on SoC Design


Book Description

This book contains extended and revised versions of the best papers presented at the 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, held in Singapore, in October 2021*. The 12 full papers included in this volume were carefully reviewed and selected from the 44 papers (out of 75 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like low-power design of RF, analog and mixed-signal circuits, EDA tools for the synthesis and verification of heterogenous SoCs, accelerators for cryptography and deep learning and on-chip Interconnection system, reliability and testing, and integration of 3D-ICs. *The conference was held virtually.




Runtime Verification


Book Description




Networks-on-Chips


Book Description

The implementation of networks-on-chip (NoC) technology in VLSI integration presents a variety of unique challenges. To deal with specific design solutions and research hurdles related to intra-chip data exchange, engineers are challenged to invoke a wide range of disciplines and specializations while maintaining a focused approach. Leading Researchers Present Cutting-Edge Designs Tools Networks-on-Chips: Theory and Practice facilitates this process, detailing the NoC paradigm and its benefits in separating IP design and functionality from chip communication requirements and interfacing. It starts with an analysis of 3-D NoC architectures and progresses to a discussion of NoC resource allocation, processor traffic modeling, and formal verification, with an examination of protocols at different layers of abstraction. An exploration of design methodologies, CAD tool development, and system testing, as well as communication protocol, the text highlights important emerging research issues, such as Resource Allocation for Quality of Service (QoS) on-chip communication Testing, verification, and network design methodologies Architectures for interconnection, real-time monitoring, and security requirements Networks-on-Chip Protocols Presents a flexible MPSoC platform to easily implement multimedia applications and evaluate future video encoding standards This useful guide tackles power and energy issues in NoC-based designs, addressing the power constraints that currently limit the embedding of more processing elements on a single chip. It covers traffic modeling and discusses the details of traffic generators. Using unique case studies and examples, it covers theoretical and practical issues, guiding readers through every phase of system design.




System-on-Chip Test Architectures


Book Description

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.