Implosion


Book Description

Implosion is a focused study of the history and uses of high-reliability, solid-state electronics, military standards, and space systems that support our national security and defense. This book is unique in combining the interdependent evolution of and interrelationships among military standards, solid-state electronics, and very high-reliability space systems. Starting with a brief description of the physics that enabled the development of the first transistor, Implosion covers the need for standardizing military electronics, which began during World War II and continues today. The book shows how these twin topics affected, and largely enabled, the highest reliability and most technologically capable robotic systems ever conceived. This riveting history helps readers: Realize the complex interdependence of solid-state electronics and practical implementations in the national security and defense space programs Understand the evolution of military standards for piece parts, quality, and reliability as they affected these programs Gain insight into the attempted reforms of federal systems acquisition of security- and defense-related space systems in the latter half of the twentieth century Appreciate the complexity of science and technology public policy decisions in the context of political, organizational, and economic realities Written in clear, jargon-free language, but with plenty of technical detail, Implosion is a must-read for aerospace and aviation engineers, manufacturers, and enthusiasts; technology students and historians; and anyone interested in the history of technology, military technology, and the space program.




Probabilistic Physics of Failure Approach to Reliability


Book Description

The book presents highly technical approaches to the probabilistic physics of failure analysis and applications to accelerated life and degradation testing to reliability prediction and assessment. Beside reviewing a select set of important failure mechanisms, the book covers basic and advanced methods of performing accelerated life test and accelerated degradation tests and analyzing the test data. The book includes a large number of very useful examples to help readers understand complicated methods described. Finally, MATLAB, R and OpenBUGS computer scripts are provided and discussed to support complex computational probabilistic analyses introduced.




Advanced Interconnects for ULSI Technology


Book Description

Finding new materials for copper/low-k interconnects is critical to the continuing development of computer chips. While copper/low-k interconnects have served well, allowing for the creation of Ultra Large Scale Integration (ULSI) devices which combine over a billion transistors onto a single chip, the increased resistance and RC-delay at the smaller scale has become a significant factor affecting chip performance. Advanced Interconnects for ULSI Technology is dedicated to the materials and methods which might be suitable replacements. It covers a broad range of topics, from physical principles to design, fabrication, characterization, and application of new materials for nano-interconnects, and discusses: Interconnect functions, characterisations, electrical properties and wiring requirements Low-k materials: fundamentals, advances and mechanical properties Conductive layers and barriers Integration and reliability including mechanical reliability, electromigration and electrical breakdown New approaches including 3D, optical, wireless interchip, and carbon-based interconnects Intended for postgraduate students and researchers, in academia and industry, this book provides a critical overview of the enabling technology at the heart of the future development of computer chips.







Design of Mechanical Systems


Book Description

This book describes how reliability can be embedded into the product development using a design methodology that uses parametric accelerated lifecycle testing (ALT) . The book has these features: • A new reliability methodology, based on inferential statistics, that can determine whether the reliability of a mechanical/civil system is achieved. • A unique reliability methodology to prevent reliability disasters in new mechanical products in the field, e.g., automobiles and airplanes. • Robust design methodology of mechanical/civil product to withstand a variety of loads. • Explanation of an alternative experimental Taguchi methodology. • Discussion of how parametric ALT can also be used to predict product reliability—lifetime and failure rate. • Detailed case studies that demonstrate parametric ALT methodology. This book will be useful for senior-level undergraduate and graduate students, professional engineers, college and university-level lecturers, researchers, and design managers in mechanical and civil engineering.




Reliability Design of Mechanical Systems


Book Description

This book describes basic reliability concepts – parametric ALT plan, failure mechanism and design, and reliability testing with acceleration factor and sample size equation. A generalized life-stress failure model with a new effort concept has been derived and recommended to calculate the acceleration factor of the mechanical system. The new sample size equation with the acceleration factor has also been derived to carry out the parametric ALT. This new parametric ALT should help a mechanical/civil engineer to uncover the design parameters affecting reliability during the design process of the mechanical system. Consequently, it should help companies to improve product reliability and avoid recalls due to the product/structure failures in the field. As the improper or missing design parameters in the design phase are experimentally identified by this new reliability design method - parametric ALT, the mechanical/civil engineering system might improve in reliability by the increase in lifetime and the reduction in failure rate.




Analog IC Reliability in Nanometer CMOS


Book Description

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.




Design of Mechanical Systems Based on Statistics


Book Description

This book introduces and explains the parametric accelerated life testing (ALT) methodology as a new reliability methodology based on statistics, to help avoid recalls of products in the marketplace. The book includes problems and case studies to help with reader comprehension. It provides an introduction to reliability design of the mechanical system as an alternative to Taguchi’s experimental methodology and enables engineers to correct faulty designs and determine if the targeted product reliability is achieved. Additionally, it presents a robust design methodology of mechanical products to withstand a variety of loads. This book is intended for engineers of many fields, including industrial engineers, mechanical engineers, and systems engineers.




Guidelines for Initiating Events and Independent Protection Layers in Layer of Protection Analysis


Book Description

The book is a guide for Layers of Protection Analysis (LOPA) practitioners. It explains the onion skin model and in particular, how it relates to the use of LOPA and the need for non-safety instrumented independent protection layers. It provides specific guidance on Independent Protection Layers (IPLs) that are not Safety Instrumented Systems (SIS). Using the LOPA methodology, companies typically take credit for risk reductions accomplished through non-SIS alternatives; i.e. administrative procedures, equipment design, etc. It addresses issues such as how to ensure the effectiveness and maintain reliability for administrative controls or “inherently safer, passive” concepts. This book will address how the fields of Human Reliability Analysis, Fault Tree Analysis, Inherent Safety, Audits and Assessments, Maintenance, and Emergency Response relate to LOPA and SIS. The book will separate IPL’s into categories such as the following: Inherent Safety eliminates a scenario or fundamentally reduces a hazard Preventive/Proactive prevents initiating event from occurring such as enhanced maintenance Preventive/Active stops chain of events after initiating event occurs but before an incident has occurred such as high level in a tank shutting off the pump. Mitigation (active or passive) minimizes impact once an incident has occurred such as closing block valves once LEL is detected in the dike (active) or the dike preventing contamination of groundwater (passive).




Theory and Practice of Quality and Reliability Engineering in Asia Industry


Book Description

This book discusses the application of quality and reliability engineering in Asian industries, and offers information for multinational companies (MNC) looking to transfer some of their operation and manufacturing capabilities to Asia and at the same time maintain high levels of reliability and quality. It is also provides small and medium enterprises (SME) in Asia with insights into producing high-quality and reliable products. It mainly comprises peer-reviewed papers that were presented at the Asian Network for Quality (ANQ) Congress 2014 held in Singapore (August, 2014), which provides a platform for companies, especially those within Asia where rapid changes and growth in manufacturing are taking place, to present their quality and reliability practices. The book presents practical demonstrations of how quality and reliability methodologies can be modified for the unique Asian market, and as such is a valuable resource for students, academics, professionals and practitioners in the field of quality and reliability.