Silicon Dioxide and the Luminescence of Related Materials


Book Description

This book is devoted to the study of the properties of materials that can be in a crystalline and glassy state. Its central focus is the physics of solids, whose structure is disordered, since the existing theories of solids are based on crystal structures. The approach adopted here is based on the comparison of data for crystals and glasses formed by the same atoms, paying particular attention to the under-explored glass-forming crystals. The book will be of interest to graduate students, solid states researchers, glass technologists, and young scientists beginning research in the field of experimental physics.




Defects in SiO2 and Related Dielectrics: Science and Technology


Book Description

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.







Crystalline Silicon


Book Description

The exciting world of crystalline silicon is the source of the spectacular advancement of discrete electronic devices and solar cells. The exploitation of ever changing properties of crystalline silicon with dimensional transformation may indicate more innovative silicon based technologies in near future. For example, the discovery of nanocrystalline silicon has largely overcome the obstacles of using silicon as optoelectronic material. The further research and development is necessary to find out the treasures hidden within this material. The book presents different forms of silicon material, their preparation and properties. The modern techniques to study the surface and interface defect states, dislocations, and so on, in different crystalline forms have been highlighted in this book. This book presents basic and applied aspects of different crystalline forms of silicon in wide range of information from materials to devices.







ERDA Energy Research Abstracts


Book Description




ERDA Energy Research Abstracts


Book Description







Radiation Therapy Dosimetry


Book Description

This comprehensive book covers the everyday use and underlying principles of radiation dosimeters used in radiation oncology clinics. It provides an up-to-date reference spanning the full range of current modalities with emphasis on practical know-how. The main audience is medical physicists, radiation oncology physics residents, and medical physics graduate students. The reader gains the necessary tools for determining which detector is best for a given application. Dosimetry of cutting edge techniques from radiosurgery to MRI-guided systems to small fields and proton therapy are all addressed. Main topics include fundamentals of radiation dosimeters, brachytherapy and external beam radiation therapy dosimetry, and dosimetry of imaging modalities. Comprised of 30 chapters authored by leading experts in the medical physics community, the book: Covers the basic principles and practical use of radiation dosimeters in radiation oncology clinics across the full range of current modalities. Focuses on providing practical guidance for those using these detectors in the clinic. Explains which detector is more suitable for a particular application. Discusses the state of the art in radiotherapy approaches, from radiosurgery and MR-guided systems to advanced range verification techniques in proton therapy. Gives critical comparisons of dosimeters for photon, electron, and proton therapies.




Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9


Book Description

This issue of ECS Transactions contains the papers presented in the symposium on Silicon Nitride, Silicon Dioxide Thin Insulating Films, and Emerging Dielectics held May 6-11, 2007 in Chicago. Papers were presented on deposition, characterization and applications of the dielectrics including high- and low-k dielectrics, as well as interface states, device characterization, reliabiliy and modeling.