Book Description
Part.1, Considers legislation to provide financial assistance to states and nonprofit associations to survey needs and construct facilities for improvement of hospital health care.
Author : United States. Congress. Senate. Committee on Labor and Public Welfare. Subcommittee on Health
Publisher :
Page : 490 pages
File Size : 24,70 MB
Release : 1954
Category : Federal aid to hospitals
ISBN :
Part.1, Considers legislation to provide financial assistance to states and nonprofit associations to survey needs and construct facilities for improvement of hospital health care.
Author : United States. Congress
Publisher :
Page : 1462 pages
File Size : 41,4 MB
Release : 1972
Category : Law
ISBN :
The Congressional Record is the official record of the proceedings and debates of the United States Congress. It is published daily when Congress is in session. The Congressional Record began publication in 1873. Debates for sessions prior to 1873 are recorded in The Debates and Proceedings in the Congress of the United States (1789-1824), the Register of Debates in Congress (1824-1837), and the Congressional Globe (1833-1873)
Author :
Publisher :
Page : 836 pages
File Size : 22,39 MB
Release : 1954
Category : Commercial statistics
ISBN :
Author : United States Sentencing Commission
Publisher :
Page : 556 pages
File Size : 13,15 MB
Release : 1988
Category : Criminal justice, Administration of
ISBN :
Author : International Monetary Fund. Statistics Dept.
Publisher : International Monetary Fund
Page : 292 pages
File Size : 40,78 MB
Release : 1962-04-01
Category : Business & Economics
ISBN : 1513534769
International Financial Statistics, April 1962
Author : Robert D. Grove
Publisher :
Page : 980 pages
File Size : 16,81 MB
Release : 1968
Category : United States
ISBN :
Author : Grant Heiken
Publisher : CUP Archive
Page : 796 pages
File Size : 20,5 MB
Release : 1991-04-26
Category : Science
ISBN : 9780521334440
The only work to date to collect data gathered during the American and Soviet missions in an accessible and complete reference of current scientific and technical information about the Moon.
Author :
Publisher :
Page : 640 pages
File Size : 41,10 MB
Release : 1844
Category : Medicine
ISBN :
Author :
Publisher :
Page : 268 pages
File Size : 15,3 MB
Release : 1906
Category : Public health
ISBN :
Author : Dieter K. Schroder
Publisher : John Wiley & Sons
Page : 800 pages
File Size : 10,27 MB
Release : 2015-06-29
Category : Technology & Engineering
ISBN : 0471739065
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.