Oxide Thin Films, Multilayers, and Nanocomposites


Book Description

This book provides a comprehensive overview of the science of nanostructured oxides. It details the fundamental techniques and methodologies involved in oxides thin film and bulk growth, characterization and device processing, as well as heterostructures. Both, experts in oxide nanostructures and experts in thin film heteroepitaxy, contribute the interactions described within this book.




Oxide Thin Films and Nanostructures


Book Description

Nanostructured oxide materials - ultra-thin films, nanoparticles and other nanometer-scale objects - play prominent roles in many aspects of our every-day life, in nature and in technological applications, among which is the all-oxide electronics of tomorrow. Due to their reduced dimensions and dimensionality, they strongly interact with their environment: gaseous atmosphere, water or support. Their novel physical and chemical properties are the subject of this book, from both a fundamental and an applied perspective. Oxide Thin Films and Nanostructures reviews and illustrates the various methodologies for their growth, fabrication, experimental and theoretical characterization. The role of key parameters such as film thickness, nanoparticle size and support interactions in driving their fundamental properties is underlined. At the ultimate thickness limit, two-dimensional oxide materials are generated, whose functionalities and potential applications are described. The emerging field of cation mixing is mentioned, which opens new avenues for engineering many oxide properties, as witnessed by natural oxide nanomaterials such as clay minerals, which, beyond their role at the Earth's surface, are now widely used in a whole range of human activities. Oxide nanomaterials are involved in many interdisciplinary fields of advanced nanotechnologies. Catalysis, photocatalysis, solar energy materials, fuel cells, corrosion protection, and biotechnological applications are amongst the areas where they are making an impact. The book outlines prototypical examples. A cautious glimpse into future developments of scientific activity is finally ventured to round off the presentation.




Hard X-ray Photoelectron Spectroscopy (HAXPES)


Book Description

This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.




Spectroscopy of Complex Oxide Interfaces


Book Description

This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.




Oxide Surfaces


Book Description

The book is a multi-author survey (in 15 chapters) of the current state of knowledge and recent developments in our understanding of oxide surfaces. The author list includes most of the acknowledged world experts in this field. The material covered includes fundamental theory and experimental studies of the geometrical, vibrational and electronic structure of such surfaces, but with a special emphasis on the chemical properties and associated reactivity. The main focus is on metal oxides but coverage extends from 'simple' rocksalt materials such as MgO through to complex transition metal oxides with different valencies.




Metal Oxide-Based Thin Film Structures


Book Description

Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena bridges the gap between thin film deposition and device development by exploring the synthesis, properties and applications of thin film interfaces. Part I deals with theoretical and experimental aspects of epitaxial growth, the structure and morphology of oxide-metal interfaces deposited with different deposition techniques and new developments in growth methods. Part II concerns analysis techniques for the electrical, optical, magnetic and structural properties of thin film interfaces. In Part III, the emphasis is on ionic and electronic transport at the interfaces of Metal-oxide thin films. Part IV discusses methods for tailoring metal oxide thin film interfaces for specific applications, including microelectronics, communication, optical electronics, catalysis, and energy generation and conservation. This book is an essential resource for anyone seeking to further their knowledge of metal oxide thin films and interfaces, including scientists and engineers working on electronic devices and energy systems and those engaged in research into electronic materials. - Introduces the theoretical and experimental aspects of epitaxial growth for the benefit of readers new to the field - Explores state-of-the-art analysis techniques and their application to interface properties in order to give a fuller understanding of the relationship between macroscopic properties and atomic-scale manipulation - Discusses techniques for tailoring thin film interfaces for specific applications, including information, electronics and energy technologies, making this book essential reading for materials scientists and engineers alike




Phononic and Electronic Excitations in Complex Oxides Studied with Advanced Infrared and Raman Spectroscopy Techniques


Book Description

This PhD thesis reports on investigations of several oxide-based materials using advanced infrared and Raman spectroscopy techniques and in combination with external stimuli such as high magnetic or electric field, sptial confinement in thin film heterostructures and the radiation with UV light. This leads to new results in the fields of superconductivity, electronic polarization states and nanoscale phenomena. Among these, the observation of anomalous polar moments is of great relevance for understanding the electric-field-induced metal-to-insulator transistion; and the demonstration that confocal Raman spectroscopy of backfolded acoustic photons in metal-oxide multilayers can be used as a powerful characterization tool for monitoring their interface properties and layer thickness is an important technical development for the engineering of such functional oxide heterostructures.




Physics of Ferroelectrics


Book Description

The past two decades have witnessed revolutionary breakthroughs in the understanding of ferroelectric materials, both from the perspective of theory and experiment. This book addresses the paradigmatic shifts in understanding brought about by these breakthroughs, including the consideration of novel fabrication methods and nanoscale applications of these materials, and new theoretical methods such as the effective Hamiltonian approach and density functional theory.




Thin Films and Heterostructures for Oxide Electronics


Book Description

Oxides form a broad subject area of research and technology development which encompasses different disciplines such as materials science, solid state chemistry, physics etc. The aim of this book is to demonstrate the interplay of these fields and to provide an introduction to the techniques and methodologies involving film growth, characterization and device processing. The literature in this field is thus fairly scattered in different research journals covering one or the other aspect of the specific activity. This situation calls for a book that will consolidate this information and thus enable a beginner as well as an expert to get an overall perspective of the field, its foundations, and its projected progress.