X-Ray Diffraction Crystallography


Book Description

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.




Geometrical Theory of Diffraction


Book Description

This book details the ideas underlying geometrical theory of diffraction (GTD) along with its relationships with other EM theories.




X-Ray Diffraction


Book Description

Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.




The Basics of Crystallography and Diffraction


Book Description

This book provides a clear and very broadly based introduction to crystallography, light, X-ray and electron diffraction - a knowledge which is essential to students in a wide range of scientific disciplines but which is otherwise generally covered in subject-specific and more mathematicallydetailed texts. The text is also designed to appeal to the more general reader since it shows, by historical and biographical references, how the subject has developed from the work and insights of successive generations of crystallographers and scientists.The book shows how an understanding of crystal structures, both inorganic and organic may be built up from simple ideas of atomic and molecular packing. Beginning with (two dimensional) examples of patterns and tilings, the concepts of lattices, symmetry point and space groups are developed."Penrose" tilings and quasiperiodic structures are also included. The reciprocal lattice and its importance in understanding the geometry of light, X-ray and electron diffraction patterns is explained in simple terms, leading to Fourier analysis in diffraction, crystal structure determination, imageformation and the diffraction-limited resolution in these techniques. Practical X-ray and electron diffraction techniques and their applications are described. A recurring theme is the common principles: the techniques are not treated in isolation.The fourth edition has been revised throughout, and includes new sections on Fourier analysis, Patterson maps, direct methods, charge flipping, group theory in crystallography, and a new chapter on the description of physical properties of crystals by tensors (Chapter 14).




X-Ray Diffraction


Book Description

Exploration of fundamentals of x-ray diffraction theory using Fourier transforms applies general results to various atomic structures, amorphous bodies, crystals, and imperfect crystals. 154 illustrations. 1963 edition.




Wave Propagation and Diffraction


Book Description

This book presents two distinct aspects of wave dynamics – wave propagation and diffraction – with a focus on wave diffraction. The authors apply different mathematical methods to the solution of typical problems in the theory of wave propagation and diffraction and analyze the obtained results. The rigorous diffraction theory distinguishes three approaches: the method of surface currents, where the diffracted field is represented as a superposition of secondary spherical waves emitted by each element (the Huygens–Fresnel principle); the Fourier method; and the separation of variables and Wiener–Hopf transformation method. Chapter 1 presents mathematical methods related to studying the problems of wave diffraction theory, while Chapter 2 deals with spectral methods in the theory of wave propagation, focusing mainly on the Fourier methods to study the Stokes (gravity) waves on the surface of inviscid fluid. Chapter 3 then presents some results of modeling the refraction of surf ace gravity waves on the basis of the ray method, which originates from geometrical optics. Chapter 4 is devoted to the diffraction of surface gravity waves and the final two chapters discuss the diffraction of waves by semi-infinite domains on the basis of method of images and present some results on the problem of propagation of tsunami waves. Lastly, it provides insights into directions for further developing the wave diffraction theory.




Seismic Diffraction


Book Description

The use of diffraction imaging to complement the seismic reflection method is rapidly gaining momentum in the oil and gas industry. As the industry moves toward exploiting smaller and more complex conventional reservoirs and extensive new unconventional resource plays, the application of the seismic diffraction method to image sub-wavelength features such as small-scale faults, fractures and stratigraphic pinchouts is expected to increase dramatically over the next few years. “Seismic Diffraction” covers seismic diffraction theory, modeling, observation, and imaging. Papers and discussion include an overview of seismic diffractions, including classic papers which introduced the potential of diffraction phenomena in seismic processing; papers on the forward modeling of seismic diffractions, with an emphasis on the theoretical principles; papers which describe techniques for diffraction mathematical modeling as well as laboratory experiments for the physical modeling of diffractions; key papers dealing with the observation of seismic diffractions, in near-surface-, reservoir-, as well as crustal studies; and key papers on diffraction imaging.




X-Ray Diffraction for Materials Research


Book Description

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.




Electron Backscatter Diffraction in Materials Science


Book Description

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).




Fundamentals of the Physical Theory of Diffraction


Book Description

This book is the first complete and comprehensive description of the modern Physical Theory of Diffraction (PTD) based on the concept of elementary edge waves (EEWs). The theory is demonstrated with the example of the diffraction of acoustic and electromagnetic waves at perfectly reflecting objects. The derived analytic expressions clearly explain the physical structure of the scattered field and describe in detail all of the reflected and diffracted rays and beams, as well as the fields in the vicinity of caustics and foci. Shadow radiation, a new fundamental component of the field, is introduced and proven to contain half of the total scattered power.