Reliability and Maintainability (RAM) Training


Book Description

The theme of this manual is failure physics - the study of how products, hardware, software, and systems fail and what can be done about it. The intent is to impart useful information, to extend the limits of production capability, and to assist in achieving low-cost reliable products. In a broader sense the manual should do more. It should underscore the urgent need for mature attitudes toward reliability. Five of the chapters were originally presented as a classroom course to over 1000 Martin Marietta engineers and technicians. Another four chapters and three appendixes have been added. We begin with a view of reliability from the years 1940 to 2000. Chapter 2 starts the training material with a review of mathematics and a description of what elements contribute to product failures. The remaining chapters elucidate basic reliability theory and the disciplines that allow us to control and eliminate failures.







STAR


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Reliability Training


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Advances in Automation and Robotics, Vol.2


Book Description

The international conference on Automation and Robotics-ICAR2011 is held during December 12-13, 2011 in Dubai, UAE. The proceedings of ICAR2011 have been published by Springer Lecture Notes in Electrical Engineering, which include 163 excellent papers selected from more than 400 submitted papers. The conference is intended to bring together the researchers and engineers/technologists working in different aspects of intelligent control systems and optimization, robotics and automation, signal processing, sensors, systems modeling and control, industrial engineering, production and management. This part of proceedings includes 82 papers contributed by many researchers in relevant topic areas covered at ICAR2011 from various countries such as France, Japan, USA, Korea and China etc. The session topic of this proceeding is signal processing and industrial engineering, production and management, which includes papers about signal reconstruction, mechanical sensors, real-time systems control system identification, change detection problems, business process modeling, production planning, scheduling and control, computer-based manufacturing technologies, systems modeling and simulation, facilities planning and management, quality control and management, precision engineering, intelligent design and manufacturing. The papers in this proceedings focus on industry engineering to promote efficiency and affect for the world, which typically showed their advanced research work recently in their various field. I am sure that discussing with many colleagues will give much more creative idea for each other on ICAR2011. All of papers with powerful evidence and detail demonstration involved the authors’ numerous time and energy will be proved valuable by their unexhausted exploring sprit. Sincere thanks to the committee and all the authors, in additionally, including anonymous reviewers from many fields and organizations. They pointed out us direction to go on research work for the world.




Reliability Prediction for Microelectronics


Book Description

RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.