Low-Frequency Noise in Advanced MOS Devices


Book Description

This is an introduction to noise, describing fundamental noise sources and basic circuit analysis, discussing characterization of low-frequency noise and offering practical advice that bridges concepts of noise theory and modelling, characterization, CMOS technology and circuits. The text offers the latest research, reviewing the most recent publications and conference presentations. The book concludes with an introduction to noise in analog/RF circuits and describes how low-frequency noise can affect these circuits.




Low-Frequency Noise in Advanced MOS Devices


Book Description

This is an introduction to noise, describing fundamental noise sources and basic circuit analysis, discussing characterization of low-frequency noise and offering practical advice that bridges concepts of noise theory and modelling, characterization, CMOS technology and circuits. The text offers the latest research, reviewing the most recent publications and conference presentations. The book concludes with an introduction to noise in analog/RF circuits and describes how low-frequency noise can affect these circuits.




Noise in Nanoscale Semiconductor Devices


Book Description

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.




Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices


Book Description

A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.




Silicon Analog Components


Book Description

This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors’ extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science. Enables engineers to understand analog device physics, and discusses important relations between process integration, device design, component characteristics, and reliability; Describes in step-by-step fashion the components that are used in analog designs, the particular characteristics of analog components, while comparing them to digital applications; Explains the second-order effects in analog devices, and trade-offs between these effects when designing components and developing an integrated process for their manufacturing.




Noise in Semiconductor Devices


Book Description

Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.




Nanoelectronics Devices: Design, Materials, and Applications (Part I)


Book Description

Nanoelectronics Devices: Design, Materials, and Applications provides information about the progress of nanomaterial and nanoelectronic devices and their applications in diverse fields (including semiconductor electronics, biomedical engineering, energy production and agriculture). The book is divided into two parts. The editors have included a blend of basic and advanced information with references to current research. The book is intended as an update for researchers and industry professionals in the field of electronics and nanotechnology. It can also serve as a reference book for students taking advanced courses in electronics and technology. The editors have included MCQs for evaluating the readers’ understanding of the topics covered in the book. Topics covered in Part 1 include basic knowledge on nanoelectronics with examples of testing different device parameters. - The present, past, and future of nanoelectronics, - An introduction to Nanoelectronics and applicability of Moore's law - Transport of charge carrier, electrode, and measurement of device parameters - Fermi level adjustment in junction less transistor, - Non-polar devices and their simulation - The negative capacitance in MOSFET devices - Effect of electrode in the device operation - Second and Sixth group semiconductors, - FinFET principal and future, Electronics and optics integration for fast processing and data communication - Batteryless photo detectors - Solar cell fabrication and applications - Van der Waals assembled nanomaterials




Tradeoffs and Optimization in Analog CMOS Design


Book Description

Analog CMOS integrated circuits are in widespread use for communications, entertainment, multimedia, biomedical, and many other applications that interface with the physical world. Although analog CMOS design is greatly complicated by the design choices of drain current, channel width, and channel length present for every MOS device in a circuit, these design choices afford significant opportunities for optimizing circuit performance. This book addresses tradeoffs and optimization of device and circuit performance for selections of the drain current, inversion coefficient, and channel length, where channel width is implicitly considered. The inversion coefficient is used as a technology independent measure of MOS inversion that permits design freely in weak, moderate, and strong inversion. This book details the significant performance tradeoffs available in analog CMOS design and guides the designer towards optimum design by describing: An interpretation of MOS modeling for the analog designer, motivated by the EKV MOS model, using tabulated hand expressions and figures that give performance and tradeoffs for the design choices of drain current, inversion coefficient, and channel length; performance includes effective gate-source bias and drain-source saturation voltages, transconductance efficiency, transconductance distortion, normalized drain-source conductance, capacitances, gain and bandwidth measures, thermal and flicker noise, mismatch, and gate and drain leakage current Measured data that validates the inclusion of important small-geometry effects like velocity saturation, vertical-field mobility reduction, drain-induced barrier lowering, and inversion-level increases in gate-referred, flicker noise voltage In-depth treatment of moderate inversion, which offers low bias compliance voltages, high transconductance efficiency, and good immunity to velocity saturation effects for circuits designed in modern, low-voltage processes Fabricated design examples that include operational transconductance amplifiers optimized for various tradeoffs in DC and AC performance, and micropower, low-noise preamplifiers optimized for minimum thermal and flicker noise A design spreadsheet, available at the book web site, that facilitates rapid, optimum design of MOS devices and circuits Tradeoffs and Optimization in Analog CMOS Design is the first book dedicated to this important topic. It will help practicing analog circuit designers and advanced students of electrical engineering build design intuition, rapidly optimize circuit performance during initial design, and minimize trial-and-error circuit simulations.




Low Power UWB CMOS Radar Sensors


Book Description

Low Power UWB CMOS Radar Sensors deals with the problem of designing low cost CMOS radar sensors. The radar sensor uses UWB signals in order to obtain a reasonable target separation capability, while maintaining a maximum signal frequency below 2 GHz. This maximum frequency value is well within the reach of current CMOS technologies. The use of UWB signals means that most of the methodologies used in the design of circuits and systems that process narrow band signals, can no longer be applied. Low Power UWB CMOS Radar Sensors provides an analysis between the interaction of UWB signals, the antennas and the processing circuits. This analysis leads to some interesting conclusions on the types of antennas and types of circuits that should be used. A methodology to compare the noise performance of UWB processing circuits is also derived. This methodology is used to analyze and design the constituting circuits of the radar transceiver. In order to validate the design methodology a CMOS prototype is designed and experimentally evaluated.




Springer Handbook of Semiconductor Devices


Book Description

This Springer Handbook comprehensively covers the topic of semiconductor devices, embracing all aspects from theoretical background to fabrication, modeling, and applications. Nearly 100 leading scientists from industry and academia were selected to write the handbook's chapters, which were conceived for professionals and practitioners, material scientists, physicists and electrical engineers working at universities, industrial R&D, and manufacturers. Starting from the description of the relevant technological aspects and fabrication steps, the handbook proceeds with a section fully devoted to the main conventional semiconductor devices like, e.g., bipolar transistors and MOS capacitors and transistors, used in the production of the standard integrated circuits, and the corresponding physical models. In the subsequent chapters, the scaling issues of the semiconductor-device technology are addressed, followed by the description of novel concept-based semiconductor devices. The last section illustrates the numerical simulation methods ranging from the fabrication processes to the device performances. Each chapter is self-contained, and refers to related topics treated in other chapters when necessary, so that the reader interested in a specific subject can easily identify a personal reading path through the vast contents of the handbook.