Massachusetts Institute of Technology Wavelength Tables: Wavelengths by element


Book Description

Contains 110,000 wavelength entries from the 1939 edition with corrections or changes indicated by a line through the entry. Read the introduction to the 1969 edition for further explanation. Wavelengths in the range of 10,000-2,000 A are covered.




Massachusetts Institute of Technology Wavelength Tables: Tables of wavelengths


Book Description

Contains 110,000 wavelength entries from the 1939 edition with corrections or changes indicated by a line through the entry. Read the introduction to the 1969 edition for further explanation. Wavelengths in the range of 10,000-2,000 A are covered.




MIT Wavelength Tables


Book Description

with INTENSITIES IN ARC, SPARK, OR DISCHARGE TUBE of more than 100,000 SPECTRUM LINES Most Strongly Emitted by the AtomicElements under Normal Conditions of Excitation BETWEEN 10,000 A. and2000 A. arranged in order of decreasing wavelengths1969 EDITION, WITH ERRATA AND CERTAIN REVISIONS with INTENSITIES IN ARC, SPARK, OR DISCHARGE TUBE of more than 100,000 SPECTRUM LINES Most Strongly Emitted by the Atomic Elements under Normal Conditions of Excitation BETWEEN 10,000 A. and 2000 A. arranged in order of decreasing wavelengths1969 EDITION, WITH ERRATA AND CERTAIN REVISIONS




Massachusetts Institute of Technology Wavelength Tables: Tables of wavelengths


Book Description

Contains 110,000 wavelength entries from the 1939 edition with corrections or changes indicated by a line through the entry. Read the introduction to the 1969 edition for further explanation. Wavelengths in the range of 10,000-2,000 A are covered.




Massachusetts Institute of Technology Wavelength Tables: Wavelengths by element


Book Description

Contains 110,000 wavelength entries from the 1939 edition with corrections or changes indicated by a line through the entry. Read the introduction to the 1969 edition for further explanation. Wavelengths in the range of 10,000-2,000 A are covered.







Semiconductor Measurements and Instrumentation


Book Description

Crystal orientation. Crystallographic defects and their observation. Resistivity and carrier-concentration measurements. Lifetime. Mobility, hall, and type measurements. Thickness measurements. Preparation of samples for microscopic examination. Microscopy and photography. The electron microscope and other analytical instruments.