Book Description
"The Measurement Quality Division, ASQ."
The Metrology Handbook
Author : Jay L. Bucher
Publisher :
Page : 0 pages
File Size : 21,45 MB
Release : 2012
Category : Calibration
ISBN : 9780873898386
Springer Handbook of Metrology and Testing
Author : Horst Czichos
Publisher : Springer Science & Business Media
Page : 1244 pages
File Size : 13,74 MB
Release : 2011-07-22
Category : Technology & Engineering
ISBN : 3642166415
Book Description
This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.
Handbook of Silicon Semiconductor Metrology
Author : Alain C. Diebold
Publisher : CRC Press
Page : 703 pages
File Size : 16,2 MB
Release : 2001-06-29
Category : Technology & Engineering
ISBN : 0203904540
Book Description
Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay
Handbook of Optical Dimensional Metrology
Author : Kevin Harding
Publisher : Taylor & Francis
Page : 497 pages
File Size : 28,74 MB
Release : 2016-04-19
Category : Science
ISBN : 1439854823
Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Metrology Handbook
Author : Nobuo Suga
Publisher :
Page : 0 pages
File Size : 23,37 MB
Release : 2016
Category : Measuring instruments
ISBN : 9780955613319
Book Description
Handbook of Surface Metrology
Author : David J. Whitehouse
Publisher : Taylor & Francis
Page : 1015 pages
File Size : 15,8 MB
Release : 2023-03-17
Category : Science
ISBN : 1351442074
Book Description
Written by the leading authority in the subject, Handbook of Surface Metrology covers every conceivable aspect of measuring and characterizing a surface. Focusing both on theory and practice, the book provides useful guidelines for the design of precision instruments and presents data on the functional importance of surfaces. It also clearly explains the essential theory relevant to surface metrology. The book defines most terms and parameters according to national and international standards. Many examples and illustrations are drawn from the esteemed author's large fund of groundbreaking research work. This unparalleled, all-encompassing "metrology bible" is beneficial for engineering postgraduate students and researchers involved in tribology, instrumentation, data processing, and metrology.
Handbook of Optical Metrology
Author : Toru Yoshizawa
Publisher : CRC Press
Page : 866 pages
File Size : 34,12 MB
Release : 2017-07-28
Category : Technology & Engineering
ISBN : 1351831844
Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Engineering Metrology and Measurements
Author : Raghavendra,
Publisher : OUP India
Page : 0 pages
File Size : 29,11 MB
Release : 2013-05
Category : Technology & Engineering
ISBN : 9780198085492
Book Description
Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
The ASQ Metrology Handbook
Author : Heather A. Wade
Publisher : Quality Press
Page : 553 pages
File Size : 31,73 MB
Release : 2023-01-04
Category : Mathematics
ISBN : 1636940218
Book Description
The ever-changing fields of science and technology have made huge leaps, thanks in part to improvements in measurements. Without metrology, these areas may not have experienced exponential growth. Developed by experts in the field as a comprehensive and practical reference, The ASQ Metrology Handbook, Third Edition provides a foundation for understanding metrology as well as calibration principles and practices. This handbook is ideal for not only metrology professionals, but also calibration professionals including calibration technicians and technologists, quality professionals, workers in testing laboratories, consultants, and instructors. Whether you are entering a new phase of your career field, investing in your own continuous improvement journey, training your fellow calibration practitioners, or preparing for ASQ’s Certified Calibration Technician (CCT) exam, this handbook provides the information, guidance, and knowledge to help you achieve your goals. New to this Third Edition: • A thorough explanation of ISO/IEC 17025:2017 • The 2019 Redefinition of the International System of Units • Updated and expanded chapters, including information about training and competency, software validation, statistics, decision rules and risk, uncertainty in measurement, mass and weighing, force, and chemical and biological measurements and uncertainties
Metrology in Chemistry
Author : Ewa Bulska
Publisher : Springer
Page : 201 pages
File Size : 22,33 MB
Release : 2018-09-29
Category : Science
ISBN : 3319992066
Book Description
In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics – such as traceability, calibration, chemical reference materials, validation and uncertainty – are covered. In addition, key aspects of laboratory management, including quality management, inter-laboratory comparisons, proficiency testing, and accreditation, are addressed.
