Microscopy and Microanalysis 1998
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Page : 1194 pages
File Size : 18,29 MB
Release : 1998
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Page : 1194 pages
File Size : 18,29 MB
Release : 1998
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Page : pages
File Size : 23,23 MB
Release : 1998
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Page : pages
File Size : 44,35 MB
Release : 1998
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Author : G. W. Bailey
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Page : 1194 pages
File Size : 15,2 MB
Release : 1998
Category : Microchemistry
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Author : G.W. Bailey
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Page : pages
File Size : 36,40 MB
Release : 1998
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Author : Microscopy Society of America
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Page : 136 pages
File Size : 26,39 MB
Release : 1998
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Author : Australian Key Centre for Microscopy and Microanalysis
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Page : pages
File Size : 48,90 MB
Release : 1998
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Author : Ludwig Reimer
Publisher : Springer
Page : 538 pages
File Size : 30,35 MB
Release : 2013-11-11
Category : Science
ISBN : 3540389679
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Page : 153 pages
File Size : 26,13 MB
Release : 1998
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Author : G. W. Bailey
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Page : pages
File Size : 29,85 MB
Release : 1999
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