Optical Properties of Dielectric Films
Author : Norman N. Axelrod
Publisher :
Page : 302 pages
File Size : 33,48 MB
Release : 1968
Category : Science
ISBN :
Optical Properties of Thin Solid Films
Author : O. S. Heavens
Publisher : Courier Corporation
Page : 276 pages
File Size : 27,59 MB
Release : 1991-01-01
Category : Science
ISBN : 0486669246
Book Description
Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 figures. 19 tables. 1955 edition.
Optical Properties of Solids
Author : Frederick Wooten
Publisher : Academic Press
Page : 273 pages
File Size : 26,60 MB
Release : 2013-10-22
Category : Science
ISBN : 1483220761
Book Description
Optical Properties of Solids covers the important concepts of intrinsic optical properties and photoelectric emission. The book starts by providing an introduction to the fundamental optical spectra of solids. The text then discusses Maxwell's equations and the dielectric function; absorption and dispersion; and the theory of free-electron metals. The quantum mechanical theory of direct and indirect transitions between bands; the applications of dispersion relations; and the derivation of an expression for the dielectric function in the self-consistent field approximation are also encompassed. The book further tackles current-current correlations; the fluctuation-dissipation theorem; and the effect of surface plasmons on optical properties and photoemission. People involved in the study of the optical properties of solids will find the book invaluable.
Materials Science
Author : Yitzhak Mastai
Publisher : BoD – Books on Demand
Page : 563 pages
File Size : 38,67 MB
Release : 2013-06-10
Category : Science
ISBN : 953511140X
Book Description
Today modern materials science is a vibrant, emerging scientific discipline at the forefront of physics, chemistry, engineering, biology and medicine, and is becoming increasingly international in scope as demonstrated by emerging international and intercontinental collaborations and exchanges. The overall purpose of this book is to provide timely and in-depth coverage of selected advanced topics in materials science. Divided into five sections, this book provides the latest research developments in many aspects of materials science. This book is of interest to both fundamental research and also to practicing scientists and will prove invaluable to all chemical engineers, industrial chemists and students in industry and academia.
Optical Properties of Surfaces
Author : Dick Bedeaux
Publisher : World Scientific
Page : 465 pages
File Size : 42,68 MB
Release : 2004
Category : Science
ISBN : 1860944507
Book Description
This invaluable book represents a substantial body of work describing the theory of the optical properties of thin island films and rough surfaces. In both cases the feature sizes are small compared to the wavelength of light. The approach is extremely rigorous and theoretically very thorough. The reflection, transmission and absorption of light are described. Computer programs that provide exact solutions for theoretical properties of thin island films are available, and this makes the book of great practical use. The early chapters present a comprehensive theoretical framework. In this new edition a chapter on reflection from gyrotropic media has been added. Contributions due to the gyrotropic nature of the interfacial layer are discussed.
Optical Thin Films
Author : James D. Rancourt
Publisher : SPIE Press
Page : 308 pages
File Size : 35,69 MB
Release : 1996
Category : Science
ISBN : 9780819422859
Book Description
Practical, user-oriented reference for engineers who must incorporate and specify coatings for filters, antiglare effects, polarization, or other purposes in optical or electro-optical systems design. It focuses on preparation techniques and characteristics of commercially available products and provides information needed to determine what type of filter is needed to solve a particular problem, what its limitations are, and how to care for it.
Spectroscopic Ellipsometry
Author : Hiroyuki Fujiwara
Publisher : John Wiley & Sons
Page : 388 pages
File Size : 11,56 MB
Release : 2007-09-27
Category : Technology & Engineering
ISBN : 9780470060186
Book Description
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Nonlinear Optics of Random Media
Author : Vladimir M. Shalaev
Publisher : Springer
Page : 159 pages
File Size : 18,95 MB
Release : 2007-09-28
Category : Science
ISBN : 3540491848
Book Description
Nonlinear Optics of Random Media reviews recent advances in in one of the most prominent fields of physics. It provides an outline of the basic models of irregular structures of random inhomogeneous media and the approaches used to describe their linear electromagnetic properties. Nonlinearities in random media are also discussed. The chapters can be read independently, so scientists and students interested in a specific problem can go directly to the relevant text.
Dielectric Films for Advanced Microelectronics
Author : Mikhail Baklanov
Publisher : John Wiley & Sons
Page : 508 pages
File Size : 24,35 MB
Release : 2007-04-04
Category : Technology & Engineering
ISBN : 0470065419
Book Description
The topic of thin films is an area of increasing importance in materials science, electrical engineering and applied solid state physics; with both research and industrial applications in microelectronics, computer manufacturing, and physical devices. Advanced, high-performance computers, high-definition TV, broadband imaging systems, flat-panel displays, robotic systems, and medical electronics and diagnostics are a few examples of the miniaturized device technologies that depend on the utilization of thin film materials. This book presents an in-depth overview of the novel developments made by the scientific leaders in the area of modern dielectric films for advanced microelectronic applications. It contains clear, concise explanations of material science of dielectric films and their problem for device operation, including high-k, low-k, medium-k dielectric films and also specific features and requirements for dielectric films used in the packaging technology. A broad range of related topics are covered, from physical principles to design, fabrication, characterization, and applications of novel dielectric films.
Ellipsometry of Functional Organic Surfaces and Films
Author : Karsten Hinrichs
Publisher : Springer Science & Business Media
Page : 369 pages
File Size : 41,14 MB
Release : 2013-10-24
Category : Science
ISBN : 3642401287
Book Description
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
