Author : Samares Kar
Publisher : The Electrochemical Society
Page : 621 pages
File Size : 13,10 MB
Release : 2010-10
Category : Science
ISBN : 1566778220
The issue of ECS Transactions will cover comprehensively all the aspects of high-k material physics and technology: Diverse High Mobility Substrates, High-k Materials, Metal Gate Electrode Materials, Deposition Techniques, Bulk Material Properties, Flat-Band Voltage Issues and Control, Interfaces, Gate Stack Reliability, Electrical, Chemical, and Physical Chatracterization, Novel Applications, High-k and Diverse Insulators for Photonics, High-k Processing/ Manufacturing.
Author : Samares Kar
Publisher : The Electrochemical Society
Page : 565 pages
File Size : 34,4 MB
Release : 2006
Category : Dielectrics
ISBN : 1566775035
This issue covers, in detail, all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, high dielectric constant materials, processing, metals for gate electrodes, interfaces, physical, chemical, and electrical characterization, gate stack reliability, and DRAM and non-volatile memories.
Author : S. Kar
Publisher : The Electrochemical Society
Page : 504 pages
File Size : 47,3 MB
Release : 2011
Category :
ISBN : 1607682575
Author : Gang He
Publisher : John Wiley & Sons
Page : 560 pages
File Size : 36,82 MB
Release : 2012-08-10
Category : Technology & Engineering
ISBN : 3527646361
A state-of-the-art overview of high-k dielectric materials for advanced field-effect transistors, from both a fundamental and a technological viewpoint, summarizing the latest research results and development solutions. As such, the book clearly discusses the advantages of these materials over conventional materials and also addresses the issues that accompany their integration into existing production technologies. Aimed at academia and industry alike, this monograph combines introductory parts for newcomers to the field as well as advanced sections with directly applicable solutions for experienced researchers and developers in materials science, physics and electrical engineering.
Author : S. Kar
Publisher : The Electrochemical Society
Page : 550 pages
File Size : 37,20 MB
Release : 2008-10
Category : Dielectrics
ISBN : 1566776511
The issue covers in detail all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, novel and still higher permittivity dielectric materials, CMOS processing with high-K layers, metals for gate electrodes, interface issues, physical, chemical, and electrical characterization, gate stack reliability, and DRAM and non-volatile memories.
Author : Samares Kar
Publisher :
Page : 330 pages
File Size : 20,5 MB
Release : 2003
Category : Science
ISBN :
Author : Samares Kar
Publisher : The Electrochemical Society
Page : 512 pages
File Size : 32,53 MB
Release : 2004
Category : Science
ISBN : 9781566774055
"This volume is the proceedings of The Second International Symposium on High Dielectric Constant Materials: Materials Science, Processing, Reliability, and Manufacturing Issues ... and was held during [the] 204th Meeting [of the Electrochemical Society] ..."--P. v.
Author : Samares Kar
Publisher : The Electrochemical Society
Page : 676 pages
File Size : 25,96 MB
Release : 2007
Category : Dielectrics
ISBN : 1566775701
This issue covers in detail all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, high dielectric constant materials, processing, metals for gate electrodes, interfaces, physical, chemical, and electrical characterization, gate stack reliability, and DRAM and non-volatile memories.
Author : S. Kar
Publisher : The Electrochemical Society
Page : 203 pages
File Size : 36,38 MB
Release : 2014
Category :
ISBN : 1607685450
Author : D. Misra
Publisher : The Electrochemical Society
Page : 411 pages
File Size : 35,86 MB
Release :
Category :
ISBN : 1607688182
