Proceedings International Test Conference 1995
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Publisher :
Page : 0 pages
File Size : 17,67 MB
Release : 1995
Category :
ISBN : 9780780329911
Proceedings, International Test Conference 1995
Author :
Publisher : Conference
Page : 1032 pages
File Size : 29,62 MB
Release : 1995
Category : Automatic test equipment
ISBN :
Book Description
International Test Conference 1995
Author :
Publisher :
Page : pages
File Size : 24,62 MB
Release : 2002
Category :
ISBN :
Book Description
Proceedings, International Test Conference 1997
Author :
Publisher :
Page : 1074 pages
File Size : 23,14 MB
Release : 1997
Category : Automatic test equipment
ISBN :
Book Description
The European Design and Test Conference: ED and TC 1995: Proceedings of the European Design and Test Conference (1995: Paris, France
Author :
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Page : pages
File Size : 32,95 MB
Release : 1995
Category :
ISBN :
Book Description
Driving Down the Cost of Test
Author :
Publisher :
Page : 1011 pages
File Size : 18,83 MB
Release : 1995
Category : Electronic digital computers
ISBN :
Book Description
International Test Conference 1995
Author :
Publisher :
Page : 1011 pages
File Size : 43,50 MB
Release : 1995
Category :
ISBN : 9780780329935
Book Description
Proceedings
Author : International Test Conference
Publisher :
Page : pages
File Size : 34,83 MB
Release : 1995
Category :
ISBN : 9780780329911
Book Description
Integrated Circuit Test Engineering
Author : Ian A. Grout
Publisher : Springer Science & Business Media
Page : 396 pages
File Size : 41,5 MB
Release : 2005-08-22
Category : Technology & Engineering
ISBN : 9781846280238
Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Author : Manoj Sachdev
Publisher : Springer Science & Business Media
Page : 343 pages
File Size : 46,29 MB
Release : 2007-06-04
Category : Technology & Engineering
ISBN : 0387465472
Book Description
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
