Quantitative Electron Microscopy,
Author : J. N. Chapman
Publisher : CRC Press
Page : 472 pages
File Size : 45,20 MB
Release : 1984
Category : Design
ISBN :
Author : J. N. Chapman
Publisher : CRC Press
Page : 472 pages
File Size : 45,20 MB
Release : 1984
Category : Design
ISBN :
Author : Symposium on Quantitative Electron Microscopy
Publisher :
Page : 605 pages
File Size : 12,84 MB
Release : 1965
Category : Electron microscopes
ISBN :
Author :
Publisher :
Page : 11 pages
File Size : 15,40 MB
Release : 1965
Category :
ISBN :
Author :
Publisher : Academic Press
Page : 296 pages
File Size : 50,18 MB
Release : 2021-03-31
Category : Technology & Engineering
ISBN : 0323850936
Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Author : Victor D. Scott
Publisher :
Page : 356 pages
File Size : 41,19 MB
Release : 1983
Category : Analytical chemistry
ISBN :
Author : Gunter F. Bahr
Publisher :
Page : 624 pages
File Size : 41,56 MB
Release : 1965
Category : Electron microscopes
ISBN :
Author : National Institutes of Health (U.S.). Intersociety Committee for Research Potential in Pathology
Publisher :
Page : 605 pages
File Size : 30,56 MB
Release : 1965
Category :
ISBN :
Author : William Lee Henstrom
Publisher :
Page : 238 pages
File Size : 44,49 MB
Release : 2000
Category :
ISBN :
Author : Peter J. Goodhew
Publisher : CRC Press
Page : 248 pages
File Size : 42,90 MB
Release : 1988-04-25
Category : Science
ISBN : 9780850664140
A comprehensive introductory text, extensively revised and updated to cover the physical basis and operation of the common types of electron microscope with illustrations of their applications. In addition, electron microscopy is compared with other modern techniques for examining both crystalline and non-crystalline materials.
Author : Joseph Goldstein
Publisher : Springer Science & Business Media
Page : 679 pages
File Size : 36,11 MB
Release : 2013-11-11
Category : Science
ISBN : 1461332737
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.