Author : Igor Djerdj
Publisher : MDPI
Page : 89 pages
File Size : 47,84 MB
Release : 2019-01-28
Category : Science
ISBN : 3038975273
This book is a printed edition of the Special Issue "Rietveld Refinement in the Characterization of Crystalline Materials" that was published in Crystals
Author : Robert E. Dinnebier
Publisher : Walter de Gruyter GmbH & Co KG
Page : 348 pages
File Size : 10,3 MB
Release : 2018-12-17
Category : Science
ISBN : 3110461382
Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.
Author : Eric J. Mittemeijer
Publisher : Springer Science & Business Media
Page : 557 pages
File Size : 42,63 MB
Release : 2013-11-21
Category : Science
ISBN : 3662067234
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author : Georg Will
Publisher : Springer Science & Business Media
Page : 232 pages
File Size : 49,37 MB
Release : 2006-01-26
Category : Science
ISBN : 3540279865
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
Author : Robert Alan Young
Publisher : International Union of Crystallography
Page : 316 pages
File Size : 26,25 MB
Release : 1995
Category : Science
ISBN :
The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since then structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial toour understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in allbranches of science that deal with materials at the atomic level.
Author : Vitalij Pecharsky
Publisher : Springer Science & Business Media
Page : 751 pages
File Size : 36,30 MB
Release : 2008-11-24
Category : Science
ISBN : 0387095799
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Author :
Publisher : DIANE Publishing
Page : 18 pages
File Size : 27,87 MB
Release : 1995
Category :
ISBN : 9781422318324
Author : D.C. Creagh
Publisher : Elsevier
Page : 519 pages
File Size : 14,27 MB
Release : 2000-06-14
Category : Social Science
ISBN : 0080540198
/inca/publications/misc/creaghcov.htmAbout the coverThis book contains twenty chapters covering a wide range of research in the fields of scientific conservation of art and archaeometry. The common thread is the use of radiation in these analyses. The term "radiation" is used in the widest possible sense. The book encompasses the use of electromagnetic radiation in its microwave, infrared, visible, ultraviolet, x ray and &ggr; ray forms and the use of particulate forms such as electrons, neutrons and charged particles for which the Planck's Law relation applies. In many cases there is an interplay between the two forms: for example, proton induced x ray emission (PIXE), secondary ion mass spectrometry (SIMS). As far as possible the chapters have been arranged in order of ascending particle energy. Thus it commences with the use of microwaves and finishes with the use of &ggr; rays. The authors were chosen on the basis of their expertise as practitioners of their particular field of study. This means that, for example, the mature fields of study such as the IR and UV study of paintings have been written by senior researchers, whereas for the emerging fields of synchrotron and neutron techniques the chapters have been written by talented researchers at the commencement of their careers.
Author : John Charles Taylor
Publisher :
Page : 201 pages
File Size : 37,26 MB
Release : 2003
Category : Cement
ISBN : 9780975079805
The Rietveld Method is a device developed by Hugo Rietveld in order to determine and caractarize crystalline materials by means of powder diffraction. Part one of this book concerns Non-Rietveld - XRD analysis using integrated intensities. Part two concerns Rietveld - a simple extension to the XRD profile from Non-Rietveld.
Author : Gubicza, Jen?
Publisher : IGI Global
Page : 359 pages
File Size : 17,19 MB
Release : 2014-03-31
Category : Technology & Engineering
ISBN : 1466658533
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
