Applied Surface Analysis
Author : Tery L. Barr
Publisher : ASTM International
Page : 215 pages
File Size : 40,61 MB
Release : 1980
Category :
ISBN :
Author : Tery L. Barr
Publisher : ASTM International
Page : 215 pages
File Size : 40,61 MB
Release : 1980
Category :
ISBN :
Author :
Publisher :
Page : 992 pages
File Size : 38,42 MB
Release : 1918
Category : Weights and measures
ISBN :
Author :
Publisher :
Page : 1290 pages
File Size : 15,80 MB
Release : 1976
Category : Weights and measures
ISBN :
Author : Donald Ray Baer
Publisher :
Page : 580 pages
File Size : 25,44 MB
Release : 1991
Category : Corrosion and anti-corrosives
ISBN :
Author : K. Kiss
Publisher : Elsevier
Page : 415 pages
File Size : 44,72 MB
Release : 2012-12-02
Category : Science
ISBN : 0444597476
This book provides the reader with a working knowledge sufficient to select microbeam techniques for the efficient, cost-effective solution of complex problems arising in today's high-tech industries. Primarily written for the industrial analyst whose field of expertise is other than microbeam analysis, it will also be of help to engineers, plant chemists and industrial research scientists who often seek the aid of the microbeam analyst in their problem solving. Research and plant managers as well as administrators may also find this book helpful since they may be called upon to select and/or approve high-priced microbeam instruments.The book is organized into two parts. Part I gives a brief description of the various techniques and critically compares their capabilities and limitations. Part II consists of selected applications which show how the various techniques or their combinations are applied to characterize materials and to guide research in a wide variety of fields. The examples and case histories will undoubtedly aid the reader in problem solving, quality assurance and research-related tasks. Newcomers to the field will find enough information in the book to enable them to begin practical work and to apply the techniques.
Author : United States. Superintendent of Documents
Publisher :
Page : 1092 pages
File Size : 23,95 MB
Release : 1977
Category : Government publications
ISBN :
February issue includes Appendix entitled Directory of United States Government periodicals and subscription publications; September issue includes List of depository libraries; June and December issues include semiannual index
Author :
Publisher :
Page : 938 pages
File Size : 41,18 MB
Release : 1987
Category : Aeronautics
ISBN :
Author : Symposium on Progress in Quantitative Surface Analysis
Publisher : ASTM International
Page : 220 pages
File Size : 13,87 MB
Release : 1986-03
Category : Analytical chemistry
ISBN : 9780803105430
Author : Tijmen Jan Moser
Publisher : SEG Books
Page : 823 pages
File Size : 25,12 MB
Release : 2016-06-30
Category : Science
ISBN : 1560803177
The use of diffraction imaging to complement the seismic reflection method is rapidly gaining momentum in the oil and gas industry. As the industry moves toward exploiting smaller and more complex conventional reservoirs and extensive new unconventional resource plays, the application of the seismic diffraction method to image sub-wavelength features such as small-scale faults, fractures and stratigraphic pinchouts is expected to increase dramatically over the next few years. “Seismic Diffraction” covers seismic diffraction theory, modeling, observation, and imaging. Papers and discussion include an overview of seismic diffractions, including classic papers which introduced the potential of diffraction phenomena in seismic processing; papers on the forward modeling of seismic diffractions, with an emphasis on the theoretical principles; papers which describe techniques for diffraction mathematical modeling as well as laboratory experiments for the physical modeling of diffractions; key papers dealing with the observation of seismic diffractions, in near-surface-, reservoir-, as well as crustal studies; and key papers on diffraction imaging.
Author :
Publisher :
Page : 1156 pages
File Size : 41,45 MB
Release : 1992
Category : Physics
ISBN :