Metal Oxide-Based Thin Film Structures


Book Description

Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena bridges the gap between thin film deposition and device development by exploring the synthesis, properties and applications of thin film interfaces. Part I deals with theoretical and experimental aspects of epitaxial growth, the structure and morphology of oxide-metal interfaces deposited with different deposition techniques and new developments in growth methods. Part II concerns analysis techniques for the electrical, optical, magnetic and structural properties of thin film interfaces. In Part III, the emphasis is on ionic and electronic transport at the interfaces of Metal-oxide thin films. Part IV discusses methods for tailoring metal oxide thin film interfaces for specific applications, including microelectronics, communication, optical electronics, catalysis, and energy generation and conservation. This book is an essential resource for anyone seeking to further their knowledge of metal oxide thin films and interfaces, including scientists and engineers working on electronic devices and energy systems and those engaged in research into electronic materials.




Thin Film Metal-Oxides


Book Description

Thin Film Metal-Oxides provides a representative account of the fundamental structure-property relations in oxide thin films. Functional properties of thin film oxides are discussed in the context of applications in emerging electronics and renewable energy technologies. Readers will find a detailed description of deposition and characterization of metal oxide thin films, theoretical treatment of select properties and their functional performance in solid state devices, from leading researchers. Scientists and engineers involved with oxide semiconductors, electronic materials and alternative energy will find Thin Film Metal-Oxides a useful reference.




Improved Charge Transfer by Thin Metal Oxide Films


Book Description

"The field of electronics has an immense impact on our day to day life. Efficient charge transfer at the semiconductor and electrode interface is one of the most crucial issues for the performance of any electronic device. A lot of effort has been spent to address this issue. A counter intuitive phenomenon of insertion of a thin metal oxide film at the semiconductor and electrode interface has gained momentum recently. In the current thesis, based on results of several experiments, I will propose a prominent mechanism of performance improvement with such insertions. I will also demonstrate the applicability of such metal oxide thin films in many other systems. First, I will introduce the scope of the thesis in detail. I will also introduce the background to understand the electronic structure of organic semiconductors, along with the interface formation at the semiconductor/metal interface. Then, I will discuss the measurement techniques. I will start the discussion on results with the insertion of a thin layer of MoOx (a transition metal oxide) between indium tin oxide (ITO) and two well studied organic semiconductors. I will also demonstrate that the optimum insertion layer thickness is just a few nanometers. I will illustrate the importance of high vacuum during the deposition of such insertion layers. I will also discuss the method to recover work function of air exposed MoOx ilms. I will further demonstrate that a thin layer of MoOx can be utilized to dope C60 strongly p-type. Then, I will discuss the application of MoOx insertion layer in CdTe based solar cells. I will further show the application of MoOx and organic double-inter-layer in organic devices. At the end, I will discuss an intense oxygen plasma treatment on ITO films and demonstrate a method to achieve high work function ITO films. The mechanism of high work function and application in devices will also be explained in detail. Finally, I will summarize the thesis"--Page ix-x.







Oxide Ultrathin Films


Book Description

A wealth of information in one accessible book. Written by international experts from multidisciplinary fields, this in-depth exploration of oxide ultrathin films covers all aspects of these systems, starting with preparation and characterization, and going on to geometrical and electronic structure, as well as applications in current and future systems and devices. From the Contents: Synthesis and Preparation of Oxide Ultrathin Films Characterization Tools of Oxide Ultrathin Films Ordered Oxide Nanostructures on Metal Surfaces Unusual Properties of Oxides and Other Insulators in the Ultrathin Limit Silica and High-K Dielectrics Thin Films in Microelectronics Oxide Passive Films and Corrosion Protection Oxide Films as Catalytic Materials and as Models of Real Catalysts Oxide Films in Spintronics Oxide Ultrathin Films in Solid Oxide Fuel Cells Transparent Conducting and Chromogenic Oxide Films as Solar Energy Materials Oxide Ultrathin Films in Sensor Applications Ferroelectricity in Ultrathin Film Capacitors Titania Thin Films in Biocompatible Materials and Medical Implants Oxide Nanowires for New Chemical Sensor Devices







Thin Films and Heterostructures for Oxide Electronics


Book Description

Oxides form a broad subject area of research and technology development which encompasses different disciplines such as materials science, solid state chemistry, physics etc. The aim of this book is to demonstrate the interplay of these fields and to provide an introduction to the techniques and methodologies involving film growth, characterization and device processing. The literature in this field is thus fairly scattered in different research journals covering one or the other aspect of the specific activity. This situation calls for a book that will consolidate this information and thus enable a beginner as well as an expert to get an overall perspective of the field, its foundations, and its projected progress.







Transport in Metal-Oxide-Semiconductor Structures


Book Description

This book focuses on the importance of mobile ions presented in oxide structures, what significantly affects the metal-oxide-semiconductor (MOS) properties. The reading starts with the definition of the MOS structure, its various aspects and different types of charges presented in their structure. A review on ionic transport mechanisms and techniques for measuring the mobile ions concentration in the oxides is given, special attention being attempted to the Charge Pumping (CP) technique associated with the Bias Thermal Stress (BTS) method. Theoretical approaches to determine the density of mobile ions as well as their distribution along the oxide thickness are also discussed. The content varies from general to very specific examples, helping the reader to learn more about transport in MOS structures.