AI Techniques for Reliability Prediction for Electronic Components


Book Description

In the industry of manufacturing and design, one major constraint has been enhancing operating performance using less time. As technology continues to advance, manufacturers are looking for better methods in predicting the condition and residual lifetime of electronic devices in order to save repair costs and their reputation. Intelligent systems are a solution for predicting the reliability of these components; however, there is a lack of research on the advancements of this smart technology within the manufacturing industry. AI Techniques for Reliability Prediction for Electronic Components provides emerging research exploring the theoretical and practical aspects of prediction methods using artificial intelligence and machine learning in the manufacturing field. Featuring coverage on a broad range of topics such as data collection, fault tolerance, and health prognostics, this book is ideally designed for reliability engineers, electronic engineers, researchers, scientists, students, and faculty members seeking current research on the advancement of reliability analysis using AI.




Linearization and Efficiency Enhancement Techniques for Silicon Power Amplifiers


Book Description

This book provides an overview of current efficiency enhancement and linearization techniques for silicon power amplifier designs. It examines the latest state of the art technologies and design techniques to address challenges for RF cellular mobile, base stations, and RF and mmW WLAN applications. Coverage includes material on current silicon (CMOS, SiGe) RF and mmW power amplifier designs, focusing on advantages and disadvantages compared with traditional GaAs implementations. With this book you will learn: - The principles of linearization and efficiency improvement techniques - The architectures allowing the optimum design of multimode Si RF and mmW power amplifiers - How to make designs more efficient by employing new design techniques such as linearization and efficiency improvement - Layout considerations - Examples of schematic, layout, simulation and measurement results - Addresses the problems of high power generation, faithful construction of non-constant envelope constellations, and efficient and well control power radiation from integrated silicon chips - Demonstrates how silicon technology can solve problems and trade-offs of power amplifier design, including price, size, complexity and efficiency - Written and edited by the top contributors to the field




Fault-tolerance and Reliability Techniques for High-density Random-access Memories


Book Description

This book deals with primarily with reliable and faul-tolerant circuit design and evaluation techniques for RAMS. It examines both the manufacturing faul-tolerance (e.g. self-repair at the time of manufacturing) and online and field-related fault-tolerance (e.g. error-correction). It talks a lot about important techniques and requirements, and explains what needs to be done and why for each of the techniques.




Design And Analysis Of Reliable And Fault-tolerant Computer Systems


Book Description

Covering both the theoretical and practical aspects of fault-tolerant mobile systems, and fault tolerance and analysis, this book tackles the current issues of reliability-based optimization of computer networks, fault-tolerant mobile systems, and fault tolerance and reliability of high speed and hierarchical networks.The book is divided into six parts to facilitate coverage of the material by course instructors and computer systems professionals. The sequence of chapters in each part ensures the gradual coverage of issues from the basics to the most recent developments. A useful set of references, including electronic sources, is listed at the end of each chapter./a




Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs


Book Description

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.




VLSI Design and Test for Systems Dependability


Book Description

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.




VLSI


Book Description

Recently the world celebrated the 60th anniversary of the invention of the first transistor. The first integrated circuit (IC) was built a decade later, with the first microprocessor designed in the early 1970s. Today, ICs are a part of nearly every aspect of our daily lives. They help us live longer and more comfortably, and do more, faster. All this is possible because of the relentless search for new materials, circuit designs, and ideas happening on a daily basis at industrial and academic institutions around the globe. Showcasing the latest advances in very-large-scale integrated (VLSI) circuits, VLSI: Circuits for Emerging Applications provides a balanced view of industrial and academic developments beyond silicon and complementary metal–oxide–semiconductor (CMOS) technology. From quantum-dot cellular automata (QCA) to chips for cochlear implants, this must-have resource: Investigates the trend of combining multiple cores in a single chip to boost performance of the overall system Describes a novel approach to enable physically unclonable functions (PUFs) using intrinsic features of a VLSI chip Examines the VLSI implementations of major symmetric and asymmetric key cryptographic algorithms, hash functions, and digital signatures Discusses nonvolatile memories such as resistive random-access memory (Re-RAM), magneto-resistive RAM (MRAM), and floating-body RAM (FB-RAM) Explores organic transistors, soft errors, photonics, nanoelectromechanical (NEM) relays, reversible computation, bioinformatics, asynchronous logic, and more VLSI: Circuits for Emerging Applications presents cutting-edge research, design architectures, materials, and uses for VLSI circuits, offering valuable insight into the current state of the art of micro- and nanoelectronics.




VLSI and Hardware Implementations using Modern Machine Learning Methods


Book Description

Machine learning is a potential solution to resolve bottleneck issues in VLSI via optimizing tasks in the design process. This book aims to provide the latest machine-learning–based methods, algorithms, architectures, and frameworks designed for VLSI design. The focus is on digital, analog, and mixed-signal design techniques, device modeling, physical design, hardware implementation, testability, reconfigurable design, synthesis and verification, and related areas. Chapters include case studies as well as novel research ideas in the given field. Overall, the book provides practical implementations of VLSI design, IC design, and hardware realization using machine learning techniques. Features: Provides the details of state-of-the-art machine learning methods used in VLSI design Discusses hardware implementation and device modeling pertaining to machine learning algorithms Explores machine learning for various VLSI architectures and reconfigurable computing Illustrates the latest techniques for device size and feature optimization Highlights the latest case studies and reviews of the methods used for hardware implementation This book is aimed at researchers, professionals, and graduate students in VLSI, machine learning, electrical and electronic engineering, computer engineering, and hardware systems.




VLSI


Book Description

The process of Integrated Circuits (IC) started its era of VLSI (Very Large Scale Integration) in 1970’s when thousands of transistors were integrated into one single chip. Nowadays we are able to integrate more than a billion transistors on a single chip. However, the term “VLSI” is still being used, though there was some effort to coin a new term ULSI (Ultra-Large Scale Integration) for fine distinctions many years ago. VLSI technology has brought tremendous benefits to our everyday life since its occurrence. VLSI circuits are used everywhere, real applications include microprocessors in a personal computer or workstation, chips in a graphic card, digital camera or camcorder, chips in a cell phone or a portable computing device, and embedded processors in an automobile, et al. VLSI covers many phases of design and fabrication of integrated circuits. For a commercial chip design, it involves system definition, VLSI architecture design and optimization, RTL (register transfer language) coding, (pre- and post-synthesis) simulation and verification, synthesis, place and route, timing analyses and timing closure, and multi-step semiconductor device fabrication including wafer processing, die preparation, IC packaging and testing, et al. As the process technology scales down, hundreds or even thousands of millions of transistors are integrated into one single chip. Hence, more and more complicated systems can be integrated into a single chip, the so-called System-on-chip (SoC), which brings to VLSI engineers ever increasingly challenges to master techniques in various phases of VLSI design. For modern SoC design, practical applications are usually speed hungry. For instance, Ethernet standard has evolved from 10Mbps to 10Gbps. Now the specification for 100Mbps Ethernet is on the way. On the other hand, with the popularity of wireless and portable computing devices, low power consumption has become extremely critical. To meet these contradicting requirements, VLSI designers have to perform optimizations at all levels of design. This book is intended to cover a wide range of VLSI design topics. The book can be roughly partitioned into four parts. Part I is mainly focused on algorithmic level and architectural level VLSI design and optimization for image and video signal processing systems. Part II addresses VLSI design optimizations for cryptography and error correction coding. Part III discusses general SoC design techniques as well as other application-specific VLSI design optimizations. The last part will cover generic nano-scale circuit-level design techniques.




Lifetime Reliability-aware Design of Integrated Circuits


Book Description

This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.