Report on the Effect of Nuclear Radiation on Semiconductor Devices (first Addendum)
Author : F. J. Reid
Publisher :
Page : 36 pages
File Size : 39,35 MB
Release : 1961
Category : Radiation
ISBN :
Author : F. J. Reid
Publisher :
Page : 36 pages
File Size : 39,35 MB
Release : 1961
Category : Radiation
ISBN :
Author : Los Alamos Scientific Laboratory
Publisher :
Page : 80 pages
File Size : 22,49 MB
Release : 1961
Category : Radiation
ISBN :
Author : F. J. Reid
Publisher :
Page : 50 pages
File Size : 49,32 MB
Release : 1960
Category : Radiation
ISBN :
Data are presented on investigations of standard silicon and germanium transistors, diodes, rectifiers, and such devices as unipolar transistors, Esaki diodes, and SiC, GaP, and selenium rectifiers. The data are intended to be sufficiently inclusive to make it valuable as a guide on effects which can be anticipated from nuclear radiation on electronic components utilizing semiconductor devices. (Author).
Author : C. Claeys
Publisher : Springer Science & Business Media
Page : 424 pages
File Size : 28,65 MB
Release : 2013-11-11
Category : Science
ISBN : 3662049740
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Author : Krzysztof Iniewski
Publisher : CRC Press
Page : 442 pages
File Size : 30,1 MB
Release : 2018-09-03
Category : Technology & Engineering
ISBN : 1351833758
Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.
Author : Frank Larin
Publisher :
Page : 312 pages
File Size : 32,68 MB
Release : 1968
Category : Semiconductors
ISBN :
Author : D. C. Jones
Publisher :
Page : 122 pages
File Size : 11,6 MB
Release : 1963
Category : Electronic apparatus and appliances
ISBN :
Author : L. W. Aukerman
Publisher :
Page : 86 pages
File Size : 34,25 MB
Release : 1959
Category : Semiconductors
ISBN :
Author : George Messenger
Publisher : Springer
Page : 984 pages
File Size : 17,53 MB
Release : 1992-05-14
Category : Juvenile Nonfiction
ISBN :
Author : Marta Bagatin
Publisher : CRC Press
Page : 394 pages
File Size : 44,49 MB
Release : 2018-09-03
Category : Technology & Engineering
ISBN : 1498722636
Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.