The Physics and Chemistry of SiO2 and the Si-SiO2 Interface--4, 2000
Author : Hisham Z. Massoud
Publisher :
Page : 562 pages
File Size : 37,61 MB
Release : 2000
Category : Nature
ISBN :
Author : Hisham Z. Massoud
Publisher :
Page : 562 pages
File Size : 37,61 MB
Release : 2000
Category : Nature
ISBN :
Author :
Publisher :
Page : 306 pages
File Size : 30,98 MB
Release : 2001
Category : Silicon dioxide
ISBN :
Author : Electrochemical Society. Dielectric Science and Technology Division
Publisher : The Electrochemical Society
Page : 304 pages
File Size : 18,8 MB
Release : 2001
Category : Science
ISBN : 9781566773133
Author : Dim-Lee Kwong
Publisher : The Electrochemical Society
Page : 458 pages
File Size : 28,27 MB
Release : 2001
Category : Technology & Engineering
ISBN : 9781566773157
"Electronics, Dielectric Science and Technology, and High Temperature Materials Divisions."
Author : Eugene V. Dirote
Publisher : Nova Publishers
Page : 234 pages
File Size : 32,2 MB
Release : 2004
Category : Technology & Engineering
ISBN : 9781590339374
Nanotechnology is a 'catch-all' description of activities at the level of atoms and molecules that have applications in the real world. A nanometer is a billionth of a meter, about 1/80,000 of the diameter of a human hair, or 10 times the diameter of a hydrogen atom. Nanotechnology is now used in precision engineering, new materials development as well as in electronics; electromechanical systems as well as mainstream biomedical applications in areas such as gene therapy, drug delivery and novel drug discovery techniques. This book presents the latest research in this frontier field. Contents: Preface; Electrospinning: A Novel Method for Metal Oxide Fibres; Nanofocusing Probe Optimisation in a Near-Field Head for an Ultra-High Density Optical Memory; Molecular Dynamics Simulation of Metallic Nanocluster Interfaces; Pre- and Post-Breakdown Conduction of Thin SiO2 Gate Oxides of MOS Devices: A Conductive Atomic Force Microscope Study; Topographic and Electrical Characterisation of Afm-Grown SiO2 on Si; Solvothermal Route used to Synthesize BN Nanocrystals and the Catalytic Effect of BN Nanocrystals; Covalently Attached Multilayer Self-Assembly Films and Micropatterns Comprising Metal
Author : Ram Ekwal Sah
Publisher : The Electrochemical Society
Page : 606 pages
File Size : 16,91 MB
Release : 2005
Category : Nature
ISBN : 9781566774598
Author : Alvin W. Strong
Publisher : John Wiley & Sons
Page : 642 pages
File Size : 46,62 MB
Release : 2009-10-13
Category : Technology & Engineering
ISBN : 047045525X
This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
Author : Cor L. Claeys
Publisher : The Electrochemical Society
Page : 636 pages
File Size : 24,17 MB
Release : 2001
Category : Technology & Engineering
ISBN : 9781566773089
Author : Electrochemical Society. Meeting
Publisher : The Electrochemical Society
Page : 652 pages
File Size : 12,56 MB
Release : 2003
Category : Science
ISBN : 9781566773478
Author : Philippe Marcus
Publisher : CRC Press
Page : 920 pages
File Size : 10,38 MB
Release : 2011-08-18
Category : Mathematics
ISBN : 1420094637
Updated to include recent results from intensive worldwide research efforts in materials science, surface science, and corrosion science, Corrosion Mechanisms in Theory and Practice, Third Edition explores the latest advances in corrosion and protection mechanisms. It presents a detailed account of the chemical and electrochemical surface reactions