X-Ray Diffraction Crystallography


Book Description

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.







Novel Microstructures for Solids


Book Description

For many years, evidence suggested that all solid materials either possessed a periodic crystal structure as proposed by the Braggs or they were amorphous glasses with no long-range order. In the 1970s, Roger Penrose hypothesized structures (Penrose tilings) with long-range order which were not periodic. The existence of a solid phase, known as a quasicrystal, that possessed the structure of a three dimensional Penrose tiling, was demonstrated experimentally in 1984 by Dan Shechtman and colleagues. Shechtman received the 2011 Nobel Prize in Chemistry for his discovery. The discovery and description of quasicrystalline materials provided the first concrete evidence that traditional crystals could be viewed as a subset of a more general category of ordered materials. This book introduces the diversity of structures that are now known to exist in solids through a consideration of quasicrystals (Part I) and the various structures of elemental carbon (Part II) and through an analysis of their relationship to conventional crystal structures. Both quasicrystals and the various allotropes of carbon are excellent examples of how our understanding of the microstructure of solids has progressed over the years beyond the concepts of traditional crystallography.




X-Ray Diffraction


Book Description

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.




Modern Diffraction Methods


Book Description

The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).




X-Ray Diffraction


Book Description

In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.







X-ray Diffraction Methods


Book Description

1. Introduction 1; 2. The nature and generation of X-rays 29; 3. The diffraction of X-rays 46; 4. Systematically absent X-ray reflections and the determination of space group 87; 5. Polycrystal or powder methods 105; 6. Orientation and projection of morphological crystals 208; 7. The Laue method 226; 8. The reciprocal lattice 239; 9. The Buerger precession method 253; 10. The rotation and oscillation methods 283; 11. The equi-inclination Weissenberg method 302; 12. Single-crystal X-ray diffractometry 343; 13. A general method for orienting a crystal 351; Appendix : 1. The 230 space groups 365; 2. The six permutation of the orthorhombic space groups 370; 3. Space-group determinative tables 372; 4. Table of 1/2 (cos2 phi/sin phi + cos2 phi/phi) 385; 5. Data for constructing stereographic scales 388; 6. Mathematical relations between reciprocal- and direct-lattice constants 391; Index 405.




Analytical Geomicrobiology


Book Description

A comprehensive handbook outlining state-of-the-art analytical techniques used in geomicrobiology, for advanced students, researchers and professional scientists.




Introduction to X-Ray Powder Diffractometry


Book Description

When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.