IEEE Std 1149.1-1990
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Page : pages
File Size : 50,81 MB
Release : 1990
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Page : pages
File Size : 50,81 MB
Release : 1990
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Page : pages
File Size : 30,70 MB
Release : 1995
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Author : Kenneth P. Parker
Publisher : Springer
Page : 581 pages
File Size : 11,67 MB
Release : 2015-11-11
Category : Technology & Engineering
ISBN : 331901174X
Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers; Explains the new IEEE 1149.8.1 subsidiary standard and applications; Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1 Digital Boundary-ScanIEEE Std 1149.4 Analog Boundary-ScanIEEE Std 1149.6 Advanced I/O TestingIEEE Std 1149.8.1 Passive Component TestingIEEE Std 1149.1-2013 The 2013 Revision of 1149.1IEEE Std 1532 In-System ConfigurationIEEE Std 1149.6-2015 The 2015 Revision of 1149.6
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Page : pages
File Size : 33,10 MB
Release : 2001
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Author : IEEE Standards Board
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Page : 0 pages
File Size : 44,43 MB
Release : 1990
Category : Boundary scan testing
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Page : pages
File Size : 23,26 MB
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Author : Institute of Electrical and Electronics Engineers
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Page : pages
File Size : 18,12 MB
Release : 1990
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Page : 200 pages
File Size : 33,71 MB
Release : 2001
Category : Boundary scan testing
ISBN : 9780738129457
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that slows rigorous description of the component-specific aspects of such testability features.
Author : IEEE Standards Board
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Page : 0 pages
File Size : 15,53 MB
Release : 1990
Category : Digital integrated circuits
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Page : pages
File Size : 20,96 MB
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