1998 ASU Electron Microscopy Workshop
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Publisher :
Page : 153 pages
File Size : 15,23 MB
Release : 1998
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ISBN :
Author :
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Page : 153 pages
File Size : 15,23 MB
Release : 1998
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Author : Alexander Ziegler
Publisher : Springer Science & Business Media
Page : 265 pages
File Size : 44,22 MB
Release : 2014-04-01
Category : Science
ISBN : 3642451527
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
Author : James A. Schwarz
Publisher : CRC Press
Page : 988 pages
File Size : 47,49 MB
Release : 2004
Category : Science
ISBN : 9780824750473
Author : Z H Zhai
Publisher : World Scientific
Page : 662 pages
File Size : 42,8 MB
Release : 1992-07-15
Category :
ISBN : 9814554820
This unique one-volume handbook provides a quick and concise reference guide for practising ophthalmologists, retinal specialists, vitreo-retinal fellows, ophthalmology residents and optometrists on the latest recommendations for managing common vitreo-retinal disorders seen in everyday retina practise. It provides comprehensive and essential information on diagnosis and management in outline and table format for conciseness and quick access. Color illustrations of important clinical manifestations are provided in an appendix.Dr Susanna Park is a Professor of ophthalmology and Director of Vitreo-retinal Fellowship and Ocular Oncology at the University of California Davis Eye Center. She has over 20 years clinical experience as a vitreo-retinal specialist and published over 100 journal papers and book chapters on the subject.
Author : Conference on Frontiers of Electron Microscopy in Materials Science
Publisher :
Page : 353 pages
File Size : 42,48 MB
Release : 1993
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Page : pages
File Size : 26,40 MB
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Author : Conference on Frontiers of Electron Microscopy in Materials Science
Publisher :
Page : 238 pages
File Size : 32,75 MB
Release : 1997
Category : Electron microscopy
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Author : C. Barry Carter
Publisher : Springer
Page : 543 pages
File Size : 35,23 MB
Release : 2016-08-24
Category : Technology & Engineering
ISBN : 3319266519
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
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Page : 374 pages
File Size : 20,54 MB
Release : 1998
Category : High technology
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Author : C. J. Kiely
Publisher : CRC Press
Page : 1320 pages
File Size : 20,22 MB
Release : 1999-12-01
Category : Science
ISBN : 9780750305778
Electron Microscopy and Analysis 1999 provides an overview of recent developments and outlines opportunities for future research in electron microscopy. The book presents the wide-ranging applications of these techniques in materials science, metallurgy, and surface science. It is an authoritative reference for academics and researchers working in materials science, instrumentation, electron optics, and condensed matter physics.