1998 Ieee International Reliability Physics Symposium Proceedings (36th Annual)
Author : Ieee
Publisher :
Page : 0 pages
File Size : 50,53 MB
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Author : Ieee
Publisher :
Page : 0 pages
File Size : 50,53 MB
Release :
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Page : 421 pages
File Size : 29,70 MB
Release : 1998
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ISBN : 9780780344006
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Page : 421 pages
File Size : 34,6 MB
Release : 1998
Category : Electronic apparatus and appliances
ISBN : 9780780344013
Author : ASM International
Publisher : ASM International
Page : 534 pages
File Size : 43,58 MB
Release : 2003-01-01
Category : Technology & Engineering
ISBN : 1615030867
Author : J. W. McPherson
Publisher : Springer
Page : 463 pages
File Size : 24,16 MB
Release : 2018-12-20
Category : Technology & Engineering
ISBN : 3319936832
This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes— all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.
Author : International Reliability Physics Symposium
Publisher :
Page : 766 pages
File Size : 49,92 MB
Release : 2004
Category : Electronic apparatus and appliances
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Page : 384 pages
File Size : 19,19 MB
Release : 1997
Category : Electronic apparatus and appliances
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Page : pages
File Size : 50,92 MB
Release : 1989
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Author : ASM International
Publisher : ASM International
Page : 666 pages
File Size : 15,20 MB
Release : 2017-12-01
Category : Technology & Engineering
ISBN : 1627081518
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author : Institute of Electrical and Electronics Engineers
Publisher :
Page : pages
File Size : 33,83 MB
Release : 2006
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ISBN : 9780780394995