2017 IEEE International Reliability Physics Symposium (IRPS)


Book Description

Study of reliability as applied to semiconductor manufacturing, automotive, PV, and other engineering disciplines International participation




75th Anniversary of the Transistor


Book Description

75th Anniversary of the Transistor 75th anniversary commemorative volume reflecting the transistor's development since inception to current state of the art 75th Anniversary of the Transistor is a commemorative anniversary volume to celebrate the invention of the transistor. The anniversary volume was conceived by the IEEE Electron Devices Society (EDS) to provide comprehensive yet compact coverage of the historical perspectives underlying the invention of the transistor and its subsequent evolution into a multitude of integration and manufacturing technologies and applications. The book reflects the transistor's development since inception to the current state of the art that continues to enable scaling to very large-scale integrated circuits of higher functionality and speed. The stages in this evolution covered are in chronological order to reflect historical developments. Narratives and experiences are provided by a select number of venerated industry and academic leaders, and retired veterans, of the semiconductor industry. 75th Anniversary of the Transistor highlights: Historical perspectives of the state-of-the-art pre-solid-state-transistor world (pre-1947) leading to the invention of the transistor Invention of the bipolar junction transistor (BJT) and analytical formulations by Shockley (1948) and their impact on the semiconductor industry Large scale integration, Moore's Law (1965) and transistor scaling (1974), and MOS/LSI, including flash memories — SRAMs, DRAMs (1963), and the Toshiba NAND flash memory (1989) Image sensors (1986), including charge-coupled devices, and related microsensor applications With comprehensive yet succinct and accessible coverage of one of the cornerstones of modern technology, 75th Anniversary of the Transistor is an essential reference for engineers, researchers, and undergraduate students looking for historical perspective from leaders in the field.




ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis


Book Description

The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.




Harnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms


Book Description

This book describes the state-of-the art of industrial and academic research in the architectural design of heterogeneous, multi/many-core processors. The authors describe methods and tools to enable next-generation embedded and high-performance heterogeneous processors to confront cost-effectively the inevitable variations by providing Dependable-Performance: correct functionality and timing guarantees throughout the expected lifetime of a platform under thermal, power, and energy constraints. Various aspects of the reliability problem are discussed, at both the circuit and architecture level, the intelligent selection of knobs and monitors in multicore platforms, and systematic design methodologies. The authors demonstrate how new techniques have been applied in real case studies from different applications domain and report on results and conclusions of those experiments. Enables readers to develop performance-dependable heterogeneous multi/many-core architectures Describes system software designs that support high performance dependability requirements Discusses and analyzes low level methodologies to tradeoff conflicting metrics, i.e. power, performance, reliability and thermal management Includes new application design guidelines to improve performance dependability




Mem-elements for Neuromorphic Circuits with Artificial Intelligence Applications


Book Description

Mem-elements for Neuromorphic Circuits with Artificial Intelligence Applications illustrates recent advances in the field of mem-elements (memristor, memcapacitor, meminductor) and their applications in nonlinear dynamical systems, computer science, analog and digital systems, and in neuromorphic circuits and artificial intelligence. The book is mainly devoted to recent results, critical aspects and perspectives of ongoing research on relevant topics, all involving networks of mem-elements devices in diverse applications. Sections contribute to the discussion of memristive materials and transport mechanisms, presenting various types of physical structures that can be fabricated to realize mem-elements in integrated circuits and device modeling. As the last decade has seen an increasing interest in recent advances in mem-elements and their applications in neuromorphic circuits and artificial intelligence, this book will attract researchers in various fields. - Covers a broad range of interdisciplinary topics between mathematics, circuits, realizations, and practical applications related to nonlinear dynamical systems, nanotechnology, analog and digital systems, computer science and artificial intelligence - Presents recent advances in the field of mem-elements (memristor, memcapacitor, meminductor) - Includes interesting applications of mem-elements in nonlinear dynamical systems, analog and digital systems, neuromorphic circuits, computer science and artificial intelligence




Long-Term Reliability of Nanometer VLSI Systems


Book Description

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.




Electromigration in Metals


Book Description

Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reliability, as well as characterisation, testing and analysis, the book follows the development of on-chip interconnects from microscale to nanoscale. Practical modeling methodologies for statistical analysis, from simple 1D approximation to complex 3D description, can be used for step-by-step development of reliable on-chip wiring stacks and industrial-grade power/ground grids. This is an ideal resource for materials scientists and reliability and chip design engineers.




Reliability of Organic Compounds in Microelectronics and Optoelectronics


Book Description

This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.




Statistical Trend Analysis of Physically Unclonable Functions


Book Description

Physically Unclonable Functions (PUFs) translate unavoidable variations in certain parameters of materials, waves, or devices into random and unique signals. They have found many applications in the Internet of Things (IoT), authentication systems, FPGA industry, several other areas in communications and related technologies, and many commercial products. Statistical Trend Analysis of Physically Unclonable Functions first presents a review on cryptographic hardware and hardware-assisted cryptography. The review highlights PUF as a mega trend in research on cryptographic hardware design. Afterwards, the authors present a combined survey and research work on PUFs using a systematic approach. As part of the survey aspect, a state-of-the-art analysis is presented as well as a taxonomy on PUFs, a life cycle, and an established ecosystem for the technology. In another part of the survey, the evolutionary history of PUFs is examined, and strategies for further research in this area are suggested. In the research side, this book presents a novel approach for trend analysis that can be applied to any technology or research area. In this method, a text mining tool is used which extracts 1020 keywords from the titles of the sample papers. Then, a classifying tool classifies the keywords into 295 meaningful research topics. The popularity of each topic is then numerically measured and analyzed over the course of time through a statistical analysis on the number of research papers related to the topic as well as the number of their citations. The authors identify the most popular topics in four different domains; over the history of PUFs, during the recent years, in top conferences, and in top journals. The results are used to present an evolution study as well as a trend analysis and develop a roadmap for future research in this area. This method gives an automatic popularity-based statistical trend analysis which eliminates the need for passing personal judgments about the direction of trends, and provides concrete evidence to the future direction of research on PUFs. Another advantage of this method is the possibility of studying a whole lot of existing research works (more than 700 in this book). This book will appeal to researchers in text mining, cryptography, hardware security, and IoT.