IEEE VLSI Test Symposium


Book Description




The VLSI Handbook


Book Description

For the new millenium, Wai-Kai Chen introduced a monumental reference for the design, analysis, and prediction of VLSI circuits: The VLSI Handbook. Still a valuable tool for dealing with the most dynamic field in engineering, this second edition includes 13 sections comprising nearly 100 chapters focused on the key concepts, models, and equations. Written by a stellar international panel of expert contributors, this handbook is a reliable, comprehensive resource for real answers to practical problems. It emphasizes fundamental theory underlying professional applications and also reflects key areas of industrial and research focus. WHAT'S IN THE SECOND EDITION? Sections on... Low-power electronics and design VLSI signal processing Chapters on... CMOS fabrication Content-addressable memory Compound semiconductor RF circuits High-speed circuit design principles SiGe HBT technology Bipolar junction transistor amplifiers Performance modeling and analysis using SystemC Design languages, expanded from two chapters to twelve Testing of digital systems Structured for convenient navigation and loaded with practical solutions, The VLSI Handbook, Second Edition remains the first choice for answers to the problems and challenges faced daily in engineering practice.




Design, Automation, and Test in Europe


Book Description

In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.




Embedded Software and Systems


Book Description

Welcome to the proceedings of the 2005 International Conference on Emb- ded Software and Systems (ICESS 2005) held in Xian, China, December 16-18, 2005. With the advent of VLSI system level integration and system-on-chip, the center of gravity of the computer industry is now moving from personal c- puting into embedded computing. Embedded software and systems are incre- ingly becoming a key technological component of all kinds of complex technical systems, ranging from vehicles, telephones, aircraft, toys, security systems, to medical diagnostics, weapons, pacemakers, climate control systems, etc. The ICESS 2005 conference provided a premier international forum for - searchers, developers and providers from academia and industry to address all resulting profound challenges; to present and discuss their new ideas, - search results, applications and experience; to improve international com- nication and cooperation; and to promote embedded software and system - dustrialization and wide applications on all aspects of embedded software and systems.




Advances in Electronic Testing


Book Description

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.




Ubiquitous Communications and Network Computing


Book Description

This book constitutes the refereed proceedings of the First International Conference on Ubiquitous Communications and Network Computing, UBICNET 2017, held in Bangalore, India, in August 2017. The 23 full papers were selected from 71 submissions and are grouped in topical sections on safety and energy efficient computing, cloud computing and mobile commerce, advanced and software defined networks, and advanced communication systems and networks.




Design and Test Technology for Dependable Systems-on-chip


Book Description

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--




Progress in VLSI Design and Test


Book Description

This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.




Nanoelectronic Device Applications Handbook


Book Description

Nanoelectronic Device Applications Handbook gives a comprehensive snapshot of the state of the art in nanodevices for nanoelectronics applications. Combining breadth and depth, the book includes 68 chapters on topics that range from nano-scaled complementary metal–oxide–semiconductor (CMOS) devices through recent developments in nano capacitors and AlGaAs/GaAs devices. The contributors are world-renowned experts from academia and industry from around the globe. The handbook explores current research into potentially disruptive technologies for a post-CMOS world. These include: Nanoscale advances in current MOSFET/CMOS technology Nano capacitors for applications such as electronics packaging and humidity sensors Single electron transistors and other electron tunneling devices Quantum cellular automata and nanomagnetic logic Memristors as switching devices and for memory Graphene preparation, properties, and devices Carbon nanotubes (CNTs), both single CNT and random network Other CNT applications such as terahertz, sensors, interconnects, and capacitors Nano system architectures for reliability Nanowire device fabrication and applications Nanowire transistors Nanodevices for spintronics The book closes with a call for a new generation of simulation tools to handle nanoscale mechanisms in realistic nanodevice geometries. This timely handbook offers a wealth of insights into the application of nanoelectronics. It is an invaluable reference and source of ideas for anyone working in the rapidly expanding field of nanoelectronics.




ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis


Book Description

The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.