A Measurement of the Lifetime of the Positive Pion
Author : K. F Kinsey
Publisher :
Page : 40 pages
File Size : 45,41 MB
Release : 1965
Category : Pion beams
ISBN :
Author : K. F Kinsey
Publisher :
Page : 40 pages
File Size : 45,41 MB
Release : 1965
Category : Pion beams
ISBN :
Author : TASSO Collaboration
Publisher :
Page : pages
File Size : 25,80 MB
Release : 1986
Category :
ISBN :
Author : L. Kirsch
Publisher :
Page : 16 pages
File Size : 37,67 MB
Release : 1966
Category : Annihilation reactions
ISBN :
Author :
Publisher :
Page : 8 pages
File Size : 28,96 MB
Release : 1986
Category :
ISBN :
Author :
Publisher :
Page : pages
File Size : 25,55 MB
Release : 1950
Category :
ISBN :
Author : Owen Chamberlain
Publisher :
Page : 8 pages
File Size : 38,77 MB
Release : 1950
Category : Mesons
ISBN :
Author : W. Murray Bullis
Publisher :
Page : 68 pages
File Size : 22,61 MB
Release : 1968
Category : Semiconductors
ISBN :
About 300 papers concerned with the measurement and interpretation of carrier lifetime in semiconductors are listed together with key words and a brief comment for each. Eight types of entries are included: Description of Methods, Analysis of Results, Standard Methods, Experimental Results, Theroetical Models, Auxiliary Procedures and Data, Reviews, and Books. Emphasis is placed on methods of carrying out measurements of carrier lifetime. Hence complete coverage was attempted and nearly two thirds of the entries appear in the first three categories. A large fraction of the papers listed describe the photoconductivity or photoconductive decay methods. The other most popular methods are based on diode characteristics or the photomagnetoelectric effect. In all, 35 methods for measuring carrier lifetime are represented by entries. In addition, representative papers which describe various models for recombination are included together with a number of papers which discuss the influence of surface recombination and trapping phenomena. Auxiliary procedures such as surface preparation, formation of ohmic contacts, control of temperature, and the like are described in some of the entries. Two indexes, a Key Word Index and an Author Index, are provided together with a classification of the various methods for measuring carrier lifetime. (Author).
Author : Dinesh C. Gupta
Publisher : ASTM International
Page : 389 pages
File Size : 36,46 MB
Release : 1998
Category : Electronic measurements
ISBN : 0803124899
Author :
Publisher :
Page : 19 pages
File Size : 46,22 MB
Release : 1988
Category :
ISBN :
Author : M. DA CUNNA BELO
Publisher :
Page : 0 pages
File Size : 44,98 MB
Release : 2002
Category :
ISBN :