Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
Author :
Publisher :
Page : 420 pages
File Size : 33,76 MB
Release : 2003
Category : Nanotechnology
ISBN :
Author :
Publisher :
Page : 420 pages
File Size : 33,76 MB
Release : 2003
Category : Nanotechnology
ISBN :
Author :
Publisher : DIANE Publishing
Page : 12 pages
File Size : 22,10 MB
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Category :
ISBN : 9781422328415
Author : Richard Haight
Publisher : World Scientific
Page : 346 pages
File Size : 50,88 MB
Release : 2012
Category : Science
ISBN : 9814322849
As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
Author : Günter Wilkening
Publisher : John Wiley & Sons
Page : 541 pages
File Size : 43,9 MB
Release : 2006-05-12
Category : Technology & Engineering
ISBN : 3527606874
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author :
Publisher :
Page : 856 pages
File Size : 20,13 MB
Release : 2005
Category : Laser materials
ISBN :
Author : Masanobu Yoshikawa
Publisher : Springer Nature
Page : 227 pages
File Size : 17,8 MB
Release : 2023-03-23
Category : Technology & Engineering
ISBN : 3031197224
This book focuses on advanced optical spectroscopy techniques for the characterization of cutting-edge semiconductor materials. It covers a wide range of techniques such as Raman, infrared, photoluminescence, and cathodoluminescence (CL) spectroscopy, including an introduction to their physical fundamentals and best operating principles. Aimed at professionals working in the research and development of semiconductors and semiconductor materials, this book looks at a broad class of materials such as silicon and silicon dioxide, nano-diamond thin films, quantum dots, and gallium oxide. In addition to the spectroscopic techniques covered, this book features a chapter devoted to the use of a scanning electron transmission microscope as an excitation source for CL spectroscopy. Written by a practicing industry expert in the field, this book is an ideal source of reference and best-practices guide for physicists, as well as materials scientists and engineers involved in the area of spectroscopy of semiconductor materials. Further, this book introduces the cutting-edge spectroscopy such as optical photothermal IR and Raman spectroscopy or terahertz time-domain spectroscopy (THz-TDS) etc.
Author : Yongtian Wang
Publisher : Springer Nature
Page : 283 pages
File Size : 30,51 MB
Release : 2021-10-28
Category : Computers
ISBN : 9811671893
This book constitutes the refereed proceedings of the 16th Conference on Image and Graphics Technologies and Applications, IGTA 2021, held in Beijing, China in June, 2021. The 21 papers presented were carefully reviewed and selected from 86 submissions. They provide a forum for sharing progresses in the areas of image processing technology; image analysis and understanding; computer vision and pattern recognition; big data mining, computer graphics and VR, as well as image technology applications. The volume contains the following thematic blocks: image processing and enhancement techniques (image information acquisition, image/video coding, image/video transmission, image/video storage, compression, completion, dehazing, reconstruction and display, etc.); biometric identification techniques (biometric identification and authentication techniques including face, fingerprint, iris and palm-print, etc.); machine vision and 3D reconstruction (visual information acquisition, camera calibration, stereo vision, 3D reconstruction, and applications of machine vision in industrial inspection, etc.); image/video big data analysis and understanding (object detection and recognition, image/video retrieval, image segmentation, matching, analysis and understanding); computer graphics (modeling, rendering, algorithm simplification and acceleration techniques, realistic scene generation, 3D reconstruction algorithm, system and application, etc.); virtual reality and human-computer interaction (virtual scene generation techniques, tracing and positioning techniques for large-scale space, augmented reality techniques, human-computer interaction techniques based on computer vision, etc.); applications of image and graphics (image/video processing and transmission, biomedical engineering applications, information security, digital watermarking, text processing and transmission, remote sensing, telemetering, etc.); other research works and surveys related to the applications of image and graphics technology.
Author : Jerzy Mikulski
Publisher : Springer
Page : 482 pages
File Size : 25,89 MB
Release : 2010-10-23
Category : Computers
ISBN : 3642164722
The idea of telematics appeared more than a decade ago and it is possible to define it, in a general and simple way, as a communication system for collecting, processing and distributing information. The transport services market is definitely the most important area for telematic applications. Transport-telematics issues constitute a field of knowledge of transport that integrates information technology and telecommunications in applications for managing and controlling traffic in transport systems, stimulating technical and organizational activities that ensure improved effectiveness and safe operation of such systems. Integrated and cooperating telematic applications constitute intelligent transport systems. The basis of such systems is to efficiently collect and process information and to manage its flow within the system. This enables supplying information from almost all areas of transport activities in real time. Intelligent transport––supported by a number of integrated telecommunications, IT measurement and control engineering solutions, and by appropriate tools and software––comprises telematic applications. They have an extensive range of use in many areas of transport, allowing the integration of the means and types of transport, including its infrastructure, business organization and management processes. This monograph is a collection of selected papers presented at the jubilee transport telematics conference, TST 2010, and is the result of the work of many scientists associated with this area of knowledge and who had spent years with the conference.
Author : Zeev Zalevsky
Publisher : Elsevier
Page : 335 pages
File Size : 35,4 MB
Release : 2014-06-18
Category : Technology & Engineering
ISBN : 0323228631
Nanophotonics is a newly developing and exciting field, with two main areas of interest: imaging/computer vision and data transport. The technologies developed in the field of nanophotonics have far reaching implications with a wide range of potential applications from faster computing power to medical applications, and "smart" eyeglasses to national security. Integrated Nanophotonic Devices explores one of the key technologies emerging within nanophotonics: that of nano-integrated photonic modulation devices and sensors. The authors introduce the scientific principles of these devices and provide a practical, applications-based approach to recent developments in the design, fabrication and experimentation of integrated photonic modulation circuits. For this second edition, all chapters have been expanded and updated to reflect this rapidly advancing field, and an entirely new chapter has been added to cover liquid crystals integrated with nanostructures. - Unlocks the technologies that will turn the rapidly growing research area of nanophotonics into a major area of commercial development, with applications in telecommunications, computing, security, and sensing - Nano-integrated photonic modulation devices and sensors are the components that will see nanophotonics moving out of the lab into a new generation of products and services - By covering the scientific fundamentals alongside technological applications, the authors open up this important multidisciplinary subject to readers from a range of scientific backgrounds
Author : Giovanni Agostini
Publisher : Elsevier
Page : 501 pages
File Size : 28,42 MB
Release : 2011-08-11
Category : Science
ISBN : 0080558151
In the last couple of decades, high-performance electronic and optoelectronic devices based on semiconductor heterostructures have been required to obtain increasingly strict and well-defined performances, needing a detailed control, at the atomic level, of the structural composition of the buried interfaces. This goal has been achieved by an improvement of the epitaxial growth techniques and by the parallel use of increasingly sophisticated characterization techniques and of refined theoretical models based on ab initio approaches. This book deals with description of both characterization techniques and theoretical models needed to understand and predict the structural and electronic properties of semiconductor heterostructures and nanostructures. - Comprehensive collection of the most powerful characterization techniques for semiconductor heterostructures and nanostructures - Most of the chapters are authored by scientists that are among the top 10 worldwide in publication ranking of the specific field - Each chapter starts with a didactic introduction on the technique - The second part of each chapter deals with a selection of top examples highlighting the power of the specific technique to analyze the properties of semiconductors