Advanced VLSI Design and Testability Issues


Book Description

This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.







Custom VLSI Microelectronics


Book Description

Aims to provide a comprehensive coverage of custom microelectronics, a branch of microelectronics whereby customer-specific circuit designs are realized in small production quantities.




Self-testing VLSI Design


Book Description

A distinctive feature of modern computer equipment development is the continuous increase in functionality and complexity of computer components. As a result of these advances, very large-scale integration (VLSI) circuits have found extensive application in the manufacture of computer products, personal computers included. Among a variety of recently evolved VLSI design technologies, the self-test VLSI design has gained particular prominence. design. A summary is given on self-test VLSI design results that have been obtained by scientists in leading scientific centres for computer integrated circuits. Emphasis is placed on the theoretical fundamentals of designing self-test VLSI building blocks, such as built-in test generators and output response analyzers. Particular attention is paid to: structural design of self-test VLSI circuits; design of universal modules for self-test VLSI circuits; and examination of the VLSI circuits for signature testability. It has been demonstrated that the design-for-testability techniques employed by this method provide ideal conditions for the straightforward implementation of self-test concepts. The work should prove useful for all those interested in both the basic facts and current research in this field.




VLSI Circuit Simulation and Optimization


Book Description

Circuit simulation has become an essential tool in circuit design and without it's aid, analogue and mixed-signal IC design would be impossible. However the applicability and limitations of circuit simulators have not been generally well understood and this book now provides a clear and easy to follow explanation of their function. The material covered includes the algorithms used in circuit simulation and the numerical techniques needed for linear and non-linear DC analysis, transient analysis and AC analysis. The book goes on to explain the numeric methods to include sensitivity and tolerance analysis and optimisation of component values for circuit design. The final part deals with logic simulation and mixed-signal simulation algorithms. There are comprehensive and detailed descriptions of the numerical methods and the material is presented in a way that provides for the needs of both experienced engineers who wish to extend their knowledge of current tools and techniques, and of advanced students and researchers who wish to develop new simulators.




Analytical Methodology of Tree Microstrip Interconnects Modelling For Signal Distribution


Book Description

This book focuses on the modelling methodology of microstrip interconnects, discussing various structures of single-input multiple-output (SIMO) tree interconnects for signal integrity (SI) engineering. Further, it describes lumped and distributed transmission line elements based on single-input single-output (SIMO) models of symmetric and asymmetric trees, and investigates more complicated phenomenon, such as interbranch coupling. The modelling approaches are based on the analytical methods using the Z-, Y- and T-matrices. The established method enables the S-parameters and voltage transfer function of SIMO tree to be determined. Providing illustrative results with frequency and time domain analyses for each tree interconnect structure, the book is a valuable resource for researchers, engineers, and graduate students in fields of analogue, RF/microwave, digital and mixed circuit design, SI and manufacturing engineering.




Electronic Design Automation


Book Description

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. - Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly - Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence - Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products - Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes




Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits


Book Description

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.