Advances in Electronic Testing


Book Description

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.







Introduction to Advanced System-on-Chip Test Design and Optimization


Book Description

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.




Principles of Testing Electronic Systems


Book Description

A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references




Advances in Food Authenticity Testing


Book Description

"Advances in Food Authenticity Testing" covers a topic that is of great importance to both the food industry whose responsibility it is to provide clear and accurate labeling of their products and maintain food safety and the government agencies and organizations that are tasked with the verification of claims of food authenticity. The adulteration of foods with cheaper alternatives has a long history, but the analytical techniques which can be implemented to test for these are ever advancing. The book covers the wide range of methods and techniques utilized in the testing of food authenticity, including new implementations and processes. The first part of the book examines, in detail, the scientific basis and the process of how these techniques are used, while other sections highlight specific examples of the use of these techniques in the testing of various foods. Written by experts in both academia and industry, the book provides the most up-to-date and comprehensive coverage of this important and rapidly progressing field. Covers a topic that is of great importance to both the food industry and the governmental agencies tasked with verifying the safety and authenticity of food productsPresents a wide range of methods and techniques utilized in the testing of food authenticity, including new implementations and processesHighlights specific examples of the use of the emerging techniques and testing strategies for various foods




Digital Circuit Testing


Book Description

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.




Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits


Book Description

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.




Computer-Based Testing and the Internet


Book Description

No topic is more central to innovation and current practice in testing and assessment today than computers and the Internet. This timely publication highlights four main themes that define current issues, technical advances and applications of computer-based testing: Advances in computer-based testing -- new test designs, item selection algorithms, exposure control issues and methods, and new tests that capitalize on the power of computer technology. Operational issues -- systems design, test security, and legal and ethical matters. New and improved uses -- for tests in employment and credentialing. The future of computer-based testing -- identifying potential issues, developments, major advances and problems to overcome. Written by internationally recognized contributors, each chapter focuses on issues of control, quality, security and technology. These issues provide the basic structure for the International Test Commission's new Guidelines on Computer-Based Testing and Testing on the Internet. The contributions to this book have played a key role in the development of these guidelines. Computer-Based Testing and the Internet is a comprehensive guide for all professionals, academics and practitioners working in the fields of education, credentialing, personnel testing and organizational assessment. It will also be of value to students developing expertise in these areas.




Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits


Book Description

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.




Introduction to Advanced System-on-Chip Test Design and Optimization


Book Description

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.