Analysis of X-ray Diffraction Line Broadening
Author : Inhe Rhee
Publisher :
Page : 140 pages
File Size : 40,4 MB
Release : 1994
Category :
ISBN :
Author : Inhe Rhee
Publisher :
Page : 140 pages
File Size : 40,4 MB
Release : 1994
Category :
ISBN :
Author : Gubicza, Jen?
Publisher : IGI Global
Page : 359 pages
File Size : 25,22 MB
Release : 2014-03-31
Category : Technology & Engineering
ISBN : 1466658533
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author :
Publisher : DIANE Publishing
Page : 10 pages
File Size : 10,13 MB
Release :
Category :
ISBN : 9781422329931
Author : Forrest B. Brown
Publisher :
Page : 156 pages
File Size : 20,41 MB
Release : 1974
Category :
ISBN :
Author : Eric J. Mittemeijer
Publisher : Springer Science & Business Media
Page : 557 pages
File Size : 10,81 MB
Release : 2013-11-21
Category : Science
ISBN : 3662067234
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author : Frank William Arnoth
Publisher :
Page : 120 pages
File Size : 31,5 MB
Release : 1965
Category : Iron-aluminum alloys
ISBN :
Author : Emil Zolotoyabko
Publisher : John Wiley & Sons
Page : 299 pages
File Size : 21,2 MB
Release : 2014-02-10
Category : Science
ISBN : 3527681183
Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.
Author : Johannes Gerardus Maria van Berkum
Publisher :
Page : 186 pages
File Size : 10,19 MB
Release : 1994
Category : X-ray crystallography
ISBN : 9789090071961
Author :
Publisher :
Page : 40 pages
File Size : 17,90 MB
Release : 1992
Category :
ISBN :
A FORTRAN77 program for calculating the dislocation density from the broadening of X-ray diffraction peaks measured from a specimen and standard was improved and altered to run on an 80386 MS-DOS based personal computer. The program models the intensity profiles as Fourier series and then extracts values for the lattice strain in the material from the calculated Fourier coefficients. The dislocation density of the specimen is obtained directly from the value for the lattice strain. This program may be used to measure lattice strain, crystallite size, lattice parameters and dislocation densities in CANDU pressure tubes. A review of the program and the theory of the analysis is presented in this report.
Author : Robert Delhez
Publisher :
Page : 233 pages
File Size : 36,84 MB
Release : 1978
Category : Electrons
ISBN :