Recombination Lifetime Measurements in Silicon
Author : Dinesh C. Gupta
Publisher : ASTM International
Page : 389 pages
File Size : 41,91 MB
Release : 1998
Category : Electronic measurements
ISBN : 0803124899
Silicon Heterojunction Solar Cells
Author : W.R. Fahrner
Publisher : Trans Tech Publications Ltd
Page : 204 pages
File Size : 46,82 MB
Release : 2006-08-15
Category : Technology & Engineering
ISBN : 3038131024
Book Description
The world of today must face up to two contradictory energy problems: on the one hand, there is the sharply growing consumer demand in countries such as China and India. On the other hand, natural resources are dwindling. Moreover, many of those countries which still possess substantial gas and oil supplies are politically unstable. As a result, renewable natural energy sources have received great attention. Among these, solar-cell technology is one of the most promising candidates. However, there still remains the problem of the manufacturing costs of such cells. Many attempts have been made to reduce the production costs of “conventional” solar cells (manufactured from monocrystalline silicon using diffusion methods) by instead using cheaper grades of silicon, and simpler pn-junction fabrication. That is the ‘hero’ of this book; the heterojunction solar cell.
Lifetime Spectroscopy
Author : Stefan Rein
Publisher : Springer Science & Business Media
Page : 513 pages
File Size : 13,30 MB
Release : 2005-11-25
Category : Science
ISBN : 3540279229
Book Description
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
Metal Impurities in Silicon-Device Fabrication
Author : Klaus Graff
Publisher : Springer Science & Business Media
Page : 228 pages
File Size : 13,2 MB
Release : 2013-03-08
Category : Technology & Engineering
ISBN : 3642975933
Book Description
A discussion of the different mechanisms responsible for contamination together with a survey of their impact on device performance. The author examines the specific properties of main and rare impurities in silicon, as well as the detection methods and requirements in modern technology. Finally, impurity gettering is studied along with modern techniques to determine gettering efficiency. Throughout all of these subjects, the book presents only reliable and up-to-date data so as to provide a thorough review of recent scientific investigations.
Semiconductor Statistics
Author : J. S. Blakemore
Publisher : Courier Corporation
Page : 404 pages
File Size : 49,73 MB
Release : 2002-01-01
Category : Science
ISBN : 0486495027
Book Description
In-depth exploration of the implications of carrier populations and Fermi energies examines distribution of electrons in energy bands and impurity levels of semiconductors. Also: kinetics of semiconductors containing excess carriers, particularly in terms of trapping, excitation, and recombination. 1962 edition.
Cleaning and Surface Conditioning Technology in Semiconductor Device Manufacturing 11
Author : Takeshi Hattori
Publisher : The Electrochemical Society
Page : 407 pages
File Size : 42,36 MB
Release : 2009-09
Category : Semiconductor wafers
ISBN : 1566777429
Book Description
This issue of ECS Transactions includes papers presented during the 11th International Symposium on Cleaning and Surface Conditioning Technology in Semiconductor Device Manufacturing held during the ECS Fall Meeting in Vienna, Austria, October 4-9, 2009.
Ultraclean Surface Processing of Silicon Wafers
Author : Takeshi Hattori
Publisher : Springer Science & Business Media
Page : 634 pages
File Size : 48,21 MB
Release : 2013-03-09
Category : Technology & Engineering
ISBN : 3662035359
Book Description
A totally new concept for clean surface processing of Si wafers is introduced in this book. Some fifty distinguished researchers and engineers from the leading Japanese semiconductor companies, such as NEC, Hitachi, Toshiba, Sony and Panasonic as well as from several universities reveal to us for the first time the secrets of these highly productive institutions. They describe the techniques and equipment necessary for the preparation of clean high-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.
Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7
Author : Dieter K. Schroder
Publisher : The Electrochemical Society
Page : 406 pages
File Size : 10,30 MB
Release : 2007
Category : Semiconductors
ISBN : 1566775698
Book Description
Diagnostic characterization techniques for semiconductor materials, devices and device processing are addressed at this symposium. It will cover new techniques as well as advances in routine analytical technology applied to semiconductor process development and manufacture. The hardcover edition includes a CD-ROM of ECS Transactions, Volume 10, Issue 1, Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007). The PDF edition also includes the ALTECH 2007 papers.
Silicon Compounds—Advances in Research and Application: 2013 Edition
Author :
Publisher : ScholarlyEditions
Page : 836 pages
File Size : 13,17 MB
Release : 2013-06-21
Category : Science
ISBN : 148168017X
Book Description
Silicon Compounds—Advances in Research and Application: 2013 Edition is a ScholarlyEditions™ book that delivers timely, authoritative, and comprehensive information about Silanes. The editors have built Silicon Compounds—Advances in Research and Application: 2013 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Silanes in this book to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Silicon Compounds—Advances in Research and Application: 2013 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.
Proceedings of the Symposium on Crystalline Defects and Contamination, Their Impact and Control in Device Manufacturing II
Author : Bernd O. Kolbesen (Chemiker.)
Publisher :
Page : 536 pages
File Size : 48,34 MB
Release : 1997
Category : Technology & Engineering
ISBN :
