Surface Chemical Analysis. Depth Profiling. Method for Sputter Rate Determination in X-Ray Photoelectron Spectroscopy. Auger Electron Spectroscopy and Secondary-ion Mass Spectrometry Sputter Depth Profiling Using Single and Multi-layer Thin Films


Book Description

Surfaces, Chemical analysis and testing, Analysis, Depth, X-ray photoelectron spectroscopy, Photoelectron spectroscopy, Spectroscopy, Auger electron spectroscopy, Ions, Films (states of matter), Thin films, Calibration, Measurement










Surface Chemical Analysis. Depth Profiling. Measurement of Sputtering Rate. Mesh-Replica Method Using a Mechanical Stylus Profilometer


Book Description

Surface chemistry, Surface properties, Chemical analysis and testing, Spectroscopy, Spectrochemical analysis, X-ray analysis, X-ray fluorescence spectrometry, Electron beams, Depth, Profile measurement, Profilometers




Surface Chemical Analysis. Depth Profiling. Methods for Ion Beam Alignment and the Associated Measurement of Current Or Current Density for Depth Profiling in AES and XPS


Book Description

CHEMICAL ANALYSIS AND TESTING, SURFACE CHEMISTRY, SURFACES, SPECTROSCOPY, CHEMICAL COMPOSITION, THICKNESS, MASS, QUANTITATIVE ANALYSIS, OPTICAL MEASUREMENT, GLOW DISCHARGES