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Dependability in Electronic Systems

Author : Nobuyasu Kanekawa

Publisher : Springer Science & Business Media

Page : 226 pages

File Size : 42,3 MB

Release : 2010-11-08

Category : Technology & Engineering

ISBN : 144196715X

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Book Description

This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.



Reliability of Electronic Components

Author : Titu I. Bajenescu

Publisher : Springer Science & Business Media

Page : 547 pages

File Size : 43,58 MB

Release : 2012-12-06

Category : Technology & Engineering

ISBN : 3642585051

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Book Description

This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.



Reliability and Failure of Electronic Materials and Devices

Author : Milton Ohring

Publisher : Academic Press

Page : 759 pages

File Size : 17,34 MB

Release : 2014-10-14

Category : Technology & Engineering

ISBN : 0080575528

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Book Description

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites



Reliability Characterisation of Electrical and Electronic Systems

Author : Jonathan Swingler

Publisher : Woodhead Publishing

Page : 350 pages

File Size : 40,31 MB

Release : 2020-11-15

Category : Technology & Engineering

ISBN : 9780081029633

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Book Description

The book charts how reliability engineering has moved from the use of sometimes arbitrary standards to an empirical scientific approach of understanding operating conditions, failure mechanisms, the need for testing for a more realistic characterisation and, new for the second edition, includes the monitoring of performance/robustness in the field. Reliability Characterisation of Electrical and Electronic Systems brings together a number of experts and key players in the discipline to concisely present the fundamentals and background to reliability theory, elaborate on the current thinking and developments behind reliability characterisation, and give a detailed account of emerging issues across a wide range of applications. The second edition has a new section titled Reliability Condition Monitoring and Prognostics for Specific Application which provides a guide to critical issues in key industrial sectors such as automotive and aerospace. There are also new chapters on areas of growing importance such as reliability methods in high-temperature electronics and reliability and testing of electric aircraft power systems. Reviews emerging areas of importance such as reliability methods in high-temperature electronics and reliability testing of electric vehicles Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing



VLSI Design and Test for Systems Dependability

Author : Shojiro Asai

Publisher : Springer

Page : 792 pages

File Size : 31,21 MB

Release : 2018-07-20

Category : Technology & Engineering

ISBN : 4431565949

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Book Description

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.



Component Reliability for Electronic Systems

Author : Titu I. Băjenescu

Publisher : Artech House

Page : 706 pages

File Size : 47,21 MB

Release : 2010

Category : Technology & Engineering

ISBN : 1596934360

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Book Description

The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.





Theory and Applications of Dependable Computer Systems

Author : Wojciech Zamojski

Publisher : Springer Nature

Page : 730 pages

File Size : 33,71 MB

Release : 2020-05-21

Category : Technology & Engineering

ISBN : 3030482561

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Book Description

This book presents selected papers from the Fifteenth International Conference on Dependability of Computer Systems (DepCoS-RELCOMEX), which illustrate the diversity of theoretical problems in analysis of performability, reliability and security of contemporary computer systems. Covering also methodologies and practical tools involved in this field, it is a valuable reference resource for scientists, researchers, practitioners and students who are dealing with these subjects. Established in 2006, DepCoS-RELCOMEX is an annual conference series organised by Wrocław University of Science and Technology. It focuses on the dependability and performability of contemporary computer systems – topics that can provide solutions to new challenges in evaluation of their reliability and efficiency. Since they are probably the most complex technical systems ever engineered by humans, the organization of modern computer systems cannot be modelled and analysed solely as structures (however complex and distributed) built only on the basis of technical resources. Instead they should be considered as a unique blend of interacting people (their needs and behaviours), networks (together with mobile properties, iCloud organisation, Internet of Everything) and a large number of users dispersed geographically and producing an unimaginable number of applications. This new, interdisciplinary approach is developing a continually increasing range of methods which apply also the latest findings in artificial intelligence (AI) and computational intelligence (CI).



Reliability Characterisation of Electrical and Electronic Systems

Author :

Publisher : Elsevier

Page : 274 pages

File Size : 25,31 MB

Release : 2014-12-24

Category : Technology & Engineering

ISBN : 1782422250

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Book Description

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. Takes a holistic approach to reliability engineering Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation



Soft Error Reliability of VLSI Circuits

Author : Behnam Ghavami

Publisher : Springer Nature

Page : 114 pages

File Size : 18,94 MB

Release : 2020-10-13

Category : Technology & Engineering

ISBN : 3030516105

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Book Description

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.