Diffraction Line Broadening Analysis
Author :
Publisher : DIANE Publishing
Page : 10 pages
File Size : 49,40 MB
Release :
Category :
ISBN : 9781422329931
Author :
Publisher : DIANE Publishing
Page : 10 pages
File Size : 49,40 MB
Release :
Category :
ISBN : 9781422329931
Author : Forrest B. Brown
Publisher :
Page : 156 pages
File Size : 20,6 MB
Release : 1974
Category :
ISBN :
Author : Inhe Rhee
Publisher :
Page : 140 pages
File Size : 17,72 MB
Release : 1994
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ISBN :
Author : Eric J. Mittemeijer
Publisher : Springer Science & Business Media
Page : 557 pages
File Size : 46,72 MB
Release : 2013-11-21
Category : Science
ISBN : 3662067234
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author : Gubicza, Jen?
Publisher : IGI Global
Page : 359 pages
File Size : 27,7 MB
Release : 2014-03-31
Category : Technology & Engineering
ISBN : 1466658533
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author : Adrianus Christiaan Vermeulen
Publisher :
Page : 142 pages
File Size : 12,15 MB
Release : 1994
Category :
ISBN : 9789090075303
Author : Johannes Gerardus Maria van Berkum
Publisher :
Page : 186 pages
File Size : 45,62 MB
Release : 1994
Category : X-ray crystallography
ISBN : 9789090071961
Author :
Publisher : Walter de Gruyter GmbH & Co KG
Page : 320 pages
File Size : 19,87 MB
Release : 2015-10-29
Category : Science
ISBN : 3486992562
Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.
Author :
Publisher :
Page : 40 pages
File Size : 12,84 MB
Release : 1992
Category :
ISBN :
A FORTRAN77 program for calculating the dislocation density from the broadening of X-ray diffraction peaks measured from a specimen and standard was improved and altered to run on an 80386 MS-DOS based personal computer. The program models the intensity profiles as Fourier series and then extracts values for the lattice strain in the material from the calculated Fourier coefficients. The dislocation density of the specimen is obtained directly from the value for the lattice strain. This program may be used to measure lattice strain, crystallite size, lattice parameters and dislocation densities in CANDU pressure tubes. A review of the program and the theory of the analysis is presented in this report.
Author : Robert L. Snyder
Publisher : International Union of Crystal
Page : 785 pages
File Size : 32,61 MB
Release : 1999
Category : Science
ISBN : 9780198501893
Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.