Dissertation Abstracts International
Author :
Publisher :
Page : 886 pages
File Size : 18,90 MB
Release : 2008
Category : Dissertations, Academic
ISBN :
Author :
Publisher :
Page : 886 pages
File Size : 18,90 MB
Release : 2008
Category : Dissertations, Academic
ISBN :
Author :
Publisher :
Page : 552 pages
File Size : 13,30 MB
Release : 2000
Category :
ISBN :
Author : Thierry Giamarchi
Publisher : Oxford University Press
Page : 464 pages
File Size : 50,40 MB
Release : 2016-07-07
Category : Science
ISBN : 0191080543
Over the last decade new experimental tools and theoretical concepts are providing new insights into collective nonequilibrium behavior of quantum systems. The exquisite control provided by laser trapping and cooling techniques allows us to observe the behavior of condensed bose and degenerate Fermi gases under nonequilibrium drive or after `quenches' in which a Hamiltonian parameter is suddenly or slowly changed. On the solid state front, high intensity short-time pulses and fast (femtosecond) probes allow solids to be put into highly excited states and probed before relaxation and dissipation occur. Experimental developments are matched by progress in theoretical techniques ranging from exact solutions of strongly interacting nonequilibrium models to new approaches to nonequilibrium numerics. The summer school `Strongly interacting quantum systems out of equilibrium' held at the Les Houches School of Physics as its XCIX session was designed to summarize this progress, lay out the open questions and define directions for future work. This books collects the lecture notes of the main courses given in this summer school.
Author : Sergei V. Kalinin
Publisher : Springer Science & Business Media
Page : 563 pages
File Size : 31,39 MB
Release : 2010-12-13
Category : Technology & Engineering
ISBN : 144197167X
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
Author : Paul C. McIntyre
Publisher :
Page : 552 pages
File Size : 16,19 MB
Release : 2001
Category : Ferroelectric devices
ISBN :
Author :
Publisher :
Page : 684 pages
File Size : 44,89 MB
Release : 1998
Category : Physics
ISBN :
Author : Rainer Waser
Publisher : John Wiley & Sons
Page : 1041 pages
File Size : 21,45 MB
Release : 2012-05-29
Category : Technology & Engineering
ISBN : 3527409270
Fachlich auf höchstem Niveau, visuell überzeugend und durchgängig farbig illustriert: Das ist die neue Auflage der praxisbewährten Einführung in spezialisierte elektronische Materialien und Bauelemente aus der Informationstechnologie. Über ein Drittel des Inhalts ist neu, alle anderen Beiträge wurden gründlich überarbeitet und aktualisiert.
Author : Sergei V. Kalinin
Publisher : Springer Science & Business Media
Page : 1002 pages
File Size : 35,57 MB
Release : 2007-04-03
Category : Technology & Engineering
ISBN : 0387286683
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Author : Jill Guyonnet
Publisher : Springer Science & Business Media
Page : 167 pages
File Size : 43,38 MB
Release : 2014-04-08
Category : Science
ISBN : 3319057502
Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization. Due to the local symmetry-breaking caused by the change in polarization, domain walls are found to possess an unexpected lateral piezoelectric response, even when this is symmetry-forbidden in the parent material. This has interesting potential applications in electromechanical devices based on ferroelectric domain patterning. Moreover, electrical conduction is shown to arise at domain walls in otherwise insulating lead zirconate titanate, the first such observation outside of multiferroic bismuth ferrite, due to the tendency of the walls to localize defects. The role of defects is then explored in the theoretical framework of disordered elastic interfaces possessing a characteristic roughness scaling and complex dynamic response. It is shown that the heterogeneous disorder landscape in ferroelectric thin films leads to a breakdown of the usual self-affine roughness, possibly related to strong pinning at individual defects. Finally, the roles of varying environmental conditions and defect densities in domain switching are explored and shown to be adequately modelled as a competition between screening effects and pinning.
Author : Umberto Celano
Publisher : Springer
Page : 424 pages
File Size : 40,4 MB
Release : 2019-08-01
Category : Science
ISBN : 3030156125
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.