Book Description
Fifty papers from the December 1997 symposium which covered the application of electrical measurements for the detection of microstructural features at all length scales. In addition to the topics covered in the first symposium--dc and ad resistivity measurements, impedance/admittance analysis, multiplane analysis and various other methods such as electron energy loss spectroscopy, ellipsometry, and capacitance voltage measurements--there are several papers which combine electrical measurements with STM, AFM, NSOM and electroluminescence techniques so that more localized information may be obtainable. Annotation copyrighted by Book News, Inc., Portland, OR