Electro Micro-metrology
Author : Jason Vaughn Clark
Publisher :
Page : 682 pages
File Size : 43,17 MB
Release : 2005
Category :
ISBN :
MOEMS
Author : M. Edward Motamedi
Publisher : SPIE Press
Page : 640 pages
File Size : 14,51 MB
Release : 2005
Category : Technology & Engineering
ISBN : 9780819450210
Book Description
This book introduces the exciting and fast-moving field of MOEMS to graduate students, scientists, and engineers by providing a foundation of both micro-optics and MEMS that will enable them to conduct future research in the field. Born from the relatively new fields of MEMS and micro-optics, MOEMS are proving to be an attractive and low-cost solution to a range of device problems requiring high optical functionality and high optical performance. MOEMS solutions include optical devices for telecommunication, sensing, and mobile systems such as v-grooves, gratings, shutters, scanners, filters, micromirrors, switches, alignment aids, lens arrays, and hermetic wafer-scale optical packaging. An international team of leading researchers contributed to this book, and it presents examples and problems employing cutting-edge MOEM devices. It will inspire researchers to further advance the design, fabrication, and analysis of MOEM systems.
Advancing Metrology for Electrotechnology to Support the U.S. Economy
Author : Joanne Surette
Publisher : DIANE Publishing
Page : 85 pages
File Size : 49,78 MB
Release : 1999-04
Category :
ISBN : 078817701X
Book Description
Presents an overview of work completed in 1997 in the Electronics & Electrical Engineering Laboratory (EEEL) of the National Institute of Standards & Technology. Selected technological accomplishments in the following fields are detailed: semiconductors, magnetics, superconductors, low frequency, microwaves, lightwaves, video, power, electromagnetic compatibility, electronic data exchange, & national electrical standards. Includes a profile of EEEL & its programs, projects, executive structure, awards & recognition, & management staff. Photographs, graphs & diagrams.
Micro-Manufacturing
Author : Muammer Koç
Publisher : John Wiley & Sons
Page : 490 pages
File Size : 45,59 MB
Release : 2011-05-06
Category : Technology & Engineering
ISBN : 1118010566
Book Description
This book is the first of its kind to collectively address design-based and mechanical micro-manufacturing topics in one place. It focuses on design and materials selection, as well as the manufacturing of micro-products using mechanical-based micro-manufacturing process technologies. After addressing the fundamentals and non-metallic-based micro-manufacturing processes in the semiconductor industry, it goes on to address specific metallic-based micro-manufacturing processes, such as: micro-forming, micro-machining, micro-molding, micro-laser processing, micro-layered manufacturing, micro-joining, micro-assembly and materials handling, and microEDM and ECM. The book provides an in-depth understanding of materials behavior at micro-scales and under different micro-scale processing conditions, while also including a wide variety of emerging micro-scale manufacturing issues and examples.
Microlithography and Metrology in Micromachining
Author :
Publisher :
Page : 154 pages
File Size : 20,42 MB
Release : 1997
Category : Microlithography
ISBN :
Book Description
Publications
Author : United States. National Bureau of Standards
Publisher :
Page : 762 pages
File Size : 13,48 MB
Release : 1960
Category : Government publications
ISBN :
Book Description
NISTIR.
Author :
Publisher :
Page : 62 pages
File Size : 50,64 MB
Release : 2001
Category :
ISBN :
Book Description
Optical Imaging and Metrology
Author : Wolfgang Osten
Publisher : John Wiley & Sons
Page : 471 pages
File Size : 17,94 MB
Release : 2012-09-10
Category : Science
ISBN : 3527648461
Book Description
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Experimental and Applied Mechanics, Volume 6
Author : Tom Proulx
Publisher : Springer Science & Business Media
Page : 859 pages
File Size : 21,17 MB
Release : 2011-06-01
Category : Technology & Engineering
ISBN : 144199792X
Book Description
This the sixth volume of six from the Annual Conference of the Society for Experimental Mechanics, 2010, brings together 128 chapters on Experimental and Applied Mechanics. It presents early findings from experimental and computational investigations including High Accuracy Optical Measurements of Surface Topography, Elastic Properties of Living Cells, Standards for Validating Stress Analyses by Integrating Simulation and Experimentation, Efficiency Enhancement of Dye-sensitized Solar Cell, and Blast Performance of Sandwich Composites With Functionally Graded Core.
Handbook of Optical Metrology
Author : Toru Yoshizawa
Publisher : CRC Press
Page : 746 pages
File Size : 41,28 MB
Release : 2009-02-25
Category : Science
ISBN : 1420019511
Book Description
The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.
