Author : Joachim Frank
Publisher : Springer Science & Business Media
Page : 464 pages
File Size : 15,92 MB
Release : 2008-03-05
Category : Science
ISBN : 0387690085
This definitive work provides a comprehensive treatment of the mathematical background and working methods of three-dimensional reconstruction from tilt series. Special emphasis is placed on the problems presented by limitations of data collection in the transmission electron microscope. The book, extensively revised and updated, takes the reader from biological specimen preparation to three-dimensional images of the cell and its components.
Author : Joachim Frank
Publisher : Plenum Publishing Corporation
Page : 399 pages
File Size : 19,96 MB
Release : 1992-01-01
Category : Science
ISBN : 0306439956
Explores the non-destructive, non-intrusive three-dimensional imaging of a biological cell by electron tomography. Within sections on imaging in the electron microscope, the mathematics of reconstruction, methods, and applications; chapters discuss sample shrinkage and radiation damage, reconstructi
Author : Brent Fultz
Publisher : Springer Science & Business Media
Page : 775 pages
File Size : 46,90 MB
Release : 2012-10-14
Category : Science
ISBN : 3642297609
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author : Michael J. Dykstra
Publisher : Springer Science & Business Media
Page : 368 pages
File Size : 12,75 MB
Release : 2012-12-06
Category : Science
ISBN : 146840010X
In this practical text, the author covers the fundamentals of biological electron microscopy - including fixation, instrumentation, and darkroom work - to provide an excellent introduction to the subject for the advanced undergraduate or graduate student.
Author : Eric Hanssen
Publisher : Springer
Page : 339 pages
File Size : 42,86 MB
Release : 2017-12-30
Category : Science
ISBN : 3319689975
This book highlights important techniques for cellular imaging and covers the basics and applications of electron tomography and related techniques. In addition, it considers practical aspects and broadens the technological focus by incorporating techniques that are only now becoming accessible (e.g. block face imaging). The first part of the book describes the electron microscopy 3D technique available to scientists around the world, allowing them to characterize organelles, cells and tissues. The major emphasis is on new technologies like scanning transmission electron microscopy (STEM) tomography, though the book also reviews some of the more proven technologies like electron tomography. In turn, the second part is dedicated to the reconstruction of data sets, signal improvement and interpretation
Author : Stephen J. Pennycook
Publisher : Springer Science & Business Media
Page : 764 pages
File Size : 19,58 MB
Release : 2011-03-24
Category : Technology & Engineering
ISBN : 1441972005
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Author : Ludwig Reimer
Publisher : Springer
Page : 532 pages
File Size : 19,25 MB
Release : 2013-11-11
Category : Science
ISBN : 3662135531
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
Author : C. Barry Carter
Publisher : Springer
Page : 543 pages
File Size : 48,18 MB
Release : 2016-08-24
Category : Technology & Engineering
ISBN : 3319266519
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Author : David B. Williams
Publisher : Springer Science & Business Media
Page : 708 pages
File Size : 46,38 MB
Release : 2013-03-09
Category : Science
ISBN : 1475725191
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Author :
Publisher : Academic Press
Page : 745 pages
File Size : 38,98 MB
Release : 2010-09-24
Category : Science
ISBN : 0123810086
The volume covers the preparation and analysis of model systems for biological electron microscopy. The volume has chapters about prokaryotic as well as eukaryotic systems that are used as so-called model organisms in modern cell biology. These systems include the most popular systems, such as budding and fission yeast, the roundworm C. elegans, the fly Drosophila, zebrafish, mouse, and Arabidopsis, but also organisms that are less frequently used in cell biology, such as Chlamydomonas, Dictyostelium, Trypanosoma, faltworms, Axolotl and others. In addition, tissues and tissue culture systems are also covered. These systems are used for very diverse areas of cell biology, such as cell division, abscission, intracellular transport, cytoskeletal organization, tissue regeneration and others. Moreover, this issue presents the currently most important methods for the preparation of biological specimens. This volume, however, is not a classic EM methods book. The methods are not the main focus of this issue. The main goal here is to cover the methods in the context of the specific requirements of specimen preparation for each model organism or systems. This will be the first compendium covering the various aspects of sample preparation of very diverse biological systems. - Covers the preparation and analysis of model systems for biological electron microscopy - Includes the most popular systems but also organisms that are less frequently used in cell biology - Presents the currently most important methods for the preparation of biological specimens - First compendium covering the various aspects of sample preparation of very diverse biological systems
