Proceedings of the Fifth International Symposium on Quantum Confinement, Nanostructures
Author : M. Cahay
Publisher :
Page : 712 pages
File Size : 17,21 MB
Release : 1999
Category : Science
ISBN :
Author : M. Cahay
Publisher :
Page : 712 pages
File Size : 17,21 MB
Release : 1999
Category : Science
ISBN :
Author : Jerzy Rużyłło
Publisher : The Electrochemical Society
Page : 668 pages
File Size : 25,95 MB
Release : 1998
Category : Technology & Engineering
ISBN : 9781566771887
Author : I. Ohdomari
Publisher : Elsevier
Page : 600 pages
File Size : 35,67 MB
Release : 2017-05-03
Category : Science
ISBN : 1483290484
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization including STM and SR techniques, single ion implementation, self-organization crystal growth, in situ measurements for process control and extremely high-spatial resolution analysis techniques, are also included. Furthermore it bridges the macroscopic, mesoscopic, and atomic-scale regimes of semicondutor interfaces, describing the state of the art in forming, controlling and characterizating unique semiconductor interfaces, which will be of practical importance in advanced devices. Intended for both technologists who require an up-to-date assessment of methods for interface formation, processing and characterization, and solid state researchers who desire the latest developments in understanding the basic mechanisms of interface physics, chemistry and electronics, this book will be a welcome addition to the existing literature.
Author : Cor L. Claeys
Publisher : The Electrochemical Society
Page : 498 pages
File Size : 42,74 MB
Release : 1998
Category : Science
ISBN : 9781566772075
Author : Vijay Nath
Publisher : Springer Nature
Page : 855 pages
File Size : 50,13 MB
Release : 2021-09-09
Category : Technology & Engineering
ISBN : 9811602751
This book presents high-quality papers from the Fifth International Conference on Microelectronics, Computing & Communication Systems (MCCS 2020). It discusses the latest technological trends and advances in MEMS and nanoelectronics, wireless communication, optical communication, instrumentation, signal processing, image processing, bioengineering, green energy, hybrid vehicles, environmental science, weather forecasting, cloud computing, renewable energy, RFID, CMOS sensors, actuators, transducers, telemetry systems, embedded systems and sensor network applications. It includes papers based on original theoretical, practical and experimental simulations, development, applications, measurements and testing. The applications and solutions discussed here provide excellent reference material for future product development.
Author :
Publisher :
Page : 764 pages
File Size : 43,20 MB
Release : 1974
Category : Nuclear energy
ISBN :
Author : Nelson J. Groom
Publisher :
Page : 744 pages
File Size : 11,19 MB
Release : 2000
Category : Actuators
ISBN :
Examines the state of technology of all areas of magnetic suspension and reviews recent developments in sensors, controls, superconducting magnet technology, and design/implementation practices.
Author : Bernd O. Kolbesen
Publisher : The Electrochemical Society
Page : 380 pages
File Size : 11,10 MB
Release : 2001
Category : Science
ISBN : 9781566773638
Author : Yoshio Nishi
Publisher : CRC Press
Page : 1720 pages
File Size : 26,36 MB
Release : 2017-12-19
Category : Technology & Engineering
ISBN : 1420017667
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Author : J Pollman
Publisher : World Scientific
Page : 818 pages
File Size : 50,25 MB
Release : 1994-06-09
Category :
ISBN : 9814552399
Semiconductor interfaces are of paramount importance in micro, nano- and optoelectronics. Basic as well as applied research on such systems is therefore of extremely high current interest. To meet the continuous need for a better understanding of semiconductor interfaces with respect to both their fundamental physical and chemical properties as well as their applications in modern opto- and microelectronics, the series of international conferences on the formation of semiconductor interfaces was begun. The fourth conference of the series held in Jülich addresses as main topics: clean semiconductor surfaces; adsorbates at semiconductor surfaces; metal-semiconductor, insulator-semiconductor and semiconductor-semiconductor interfaces; devices and wet chemical processes. The 12 invited lectures assess the present status of the research in important areas and about 180 contributed papers describe most recent achievements in the field.