Fifty Years of X-ray Diffraction
Author : Paul Peter Ewald
Publisher :
Page : 748 pages
File Size : 34,56 MB
Release : 1962
Category : Crystallography
ISBN :
Author : Paul Peter Ewald
Publisher :
Page : 748 pages
File Size : 34,56 MB
Release : 1962
Category : Crystallography
ISBN :
Author : P.P. Ewald
Publisher : Springer Science & Business Media
Page : 735 pages
File Size : 32,87 MB
Release : 2012-12-06
Category : Science
ISBN : 146159961X
Origin, Scope, and Plan of this Book In July 1962 the fiftieth anniversary of Max von Laue's discovery of the Diffraction of X-rays by crystals is going to be celebrated in Munich by a large international group of crystallographers, physi cists, chemists, spectroscopists, biologists, industrialists, and many others who are employing the methods based on Laue's discovery for their own research. The invitation for this celebration will be issued jointly by the Ludwig Maximilian University of Munich, where the discovery was made, by the Bavarian Academy of Sciences, where it was first made public, and by the International Union of Crystallo graphy, which is the international organization of the National Committees of Crystallography formed in some 30 countries to repre sent and advance the interests of the 3500 research workers in this field. The year 1912 also is the birth year of two branches of the physical sciences which developed promptly from Laue's discovery, namely X-ray Crystal Structure Analysis which is most closely linked to the names ofW. H. (Sir William) Bragg and W. L. (Sir Lawrence) Bragg, and X-ray Spectroscopy which is associated with the names of W. H. Bragg, H. G. J. Moseley, M. de Broglie and Manne Siegbahn. Crystal Structure Analysis began in November 1912 with the first papers ofW. L. Bragg, then still a student in Cambridge, in which, by analysis of the Laue diagrams _of zinc blende, he determined the correct lattice upon which the structure of this crystal is built.
Author : B. E. Warren
Publisher : Courier Corporation
Page : 402 pages
File Size : 24,65 MB
Release : 2012-05-23
Category : Science
ISBN : 0486141616
Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.
Author : Bernard D. Cullity
Publisher : Pearson
Page : 656 pages
File Size : 35,23 MB
Release : 2013-11-01
Category : X-ray crystallography
ISBN : 9781292040547
Designed for Junior/Senior undergraduate courses. This revision of a classical text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The text is a collection of principles and methods designed directly for the student and not a reference tool for the advanced reader
Author : A. Guinier
Publisher : Courier Corporation
Page : 404 pages
File Size : 13,83 MB
Release : 2013-01-17
Category : Science
ISBN : 0486141349
Exploration of fundamentals of x-ray diffraction theory using Fourier transforms applies general results to various atomic structures, amorphous bodies, crystals, and imperfect crystals. 154 illustrations. 1963 edition.
Author : John R. Helliwell
Publisher : CRC Press
Page : 176 pages
File Size : 36,48 MB
Release : 2015-11-16
Category : Medical
ISBN : 1498732119
Crystallography is one of the most multidisciplinary sciences, with roots in fields as varied as mathematics, physics, chemistry, biology, materials science, computation and earth and planetary science. The structural knowledge gained from crystallography has been instrumental in acquiring new levels of understanding in numerous scientific areas. P
Author : Mahmood Aliofkhazraei
Publisher : Elsevier
Page : 500 pages
File Size : 40,4 MB
Release : 2021-03-06
Category : Science
ISBN : 044463245X
Handbook of Modern Coating Technologies: Advanced Characterization Methods reviews advanced characterization methods of modern coating technologies. The topics in this volume consist of scanning vibrating electrode technique, spectroscopic ellipsometry, advances in X-ray diffraction, neutron reflectivity, micro- and nanoprobes, fluorescence technique, stress measurement methods in thin films, micropotentiometry, and localized corrosion studies.
Author : John Jenkin
Publisher : OUP Oxford
Page : 480 pages
File Size : 38,15 MB
Release : 2011-04-07
Category : Science
ISBN : 0191620769
In 1912 Lawrence Bragg explained the interaction of X-rays with crystals, and he and his father, William thereby pioneered X-ray spectroscopy and X-ray crystallography. They then led the latter field internationally for fifty years, when most areas of science were transformed by the knowledge they created: physics, chemistry, geology, materials science, electronics, and most recently biology and medical science. This book charts how this humble pair (William English, his son Australian) rose from obscurity to international prominence and then back to current, undeserved obscurity. Attention is also given to the crucial roles of both father and son during the dreadful years of the First World War, and to William's early and unshakeable belief in the dual wave and particle natures of radiation and his eventual vindication. Unlike earlier studies, the book highlights the intimate interactions between father and son that made their project possible, emphasizes personal, family, and wider human relationships, and offers new insights into teaching and research in a British colonial setting.
Author : Library of Congress. Copyright Office
Publisher : Copyright Office, Library of Congress
Page : 1222 pages
File Size : 31,97 MB
Release : 1964
Category : Copyright
ISBN :
Includes Part 1, Number 1: Books and Pamphlets, Including Serials and Contributions to Periodicals (January - June)
Author : Georg Will
Publisher : Springer Science & Business Media
Page : 232 pages
File Size : 42,1 MB
Release : 2006-01-26
Category : Science
ISBN : 3540279865
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.