Author :
Publisher :
Page : 58 pages
File Size : 11,24 MB
Release : 1859
Category :
ISBN :
Author : International Monetary Fund. Secretary's Department
Publisher : International Monetary Fund
Page : 294 pages
File Size : 26,10 MB
Release : 1988-11-14
Category : Business & Economics
ISBN : 1475561091
The speeches made by officials attending the IMF–World Bank Annual Meetings are published in this volume, along with the press communiqués issued by the International Monetary and Financial Committee and the Development Committee at the conclusion of the meetings.
Author : Mercantile Library Association (New York, N.Y.)
Publisher :
Page : 186 pages
File Size : 44,88 MB
Release : 1863
Category :
ISBN :
Author : Canada. Department of Labour
Publisher :
Page : 756 pages
File Size : 42,11 MB
Release : 1902
Category : Labor
ISBN :
Author : Commission baleinière internationale
Publisher :
Page : 584 pages
File Size : 28,72 MB
Release : 1993
Category :
ISBN : 9780906975329
Author : New York (State) School for the deaf, White Plains
Publisher :
Page : 72 pages
File Size : 12,70 MB
Release : 1862
Category :
ISBN :
Author : Cincinnati, Hamilton, and Dayton Railroad Company
Publisher :
Page : 684 pages
File Size : 33,21 MB
Release : 1850
Category :
ISBN :
Author : New York State Library (Albany, NY)
Publisher :
Page : 74 pages
File Size : 23,61 MB
Release : 1860
Category :
ISBN :
Author : Derek J. Oddy
Publisher : Boydell Press
Page : 300 pages
File Size : 20,66 MB
Release : 2003
Category : Cooking
ISBN : 9780851159348
Table of contents
Author : William J. Reese
Publisher : Harvard University Press
Page : 309 pages
File Size : 26,40 MB
Release : 2013-03-01
Category : Education
ISBN : 0674075676
Despite claims that written exams narrowed the curriculum, ruined children’s health, and turned teachers into automatons, once tests took root in American schools their legitimacy was never seriously challenged. William Reese puts today’s battles over standards and benchmarks into perspective by showcasing the history of the pencil-and-paper exam.
