Growth and Characterization of C60 Thin Films
Author : Jae Hui Rhee
Publisher :
Page : 232 pages
File Size : 12,7 MB
Release : 2004
Category : Fullerenes
ISBN :
Author : Jae Hui Rhee
Publisher :
Page : 232 pages
File Size : 12,7 MB
Release : 2004
Category : Fullerenes
ISBN :
Author : Mohamed Henini
Publisher : Elsevier
Page : 790 pages
File Size : 32,73 MB
Release : 2018-06-27
Category : Science
ISBN : 0128121378
Molecular Beam Epitaxy (MBE): From Research to Mass Production, Second Edition, provides a comprehensive overview of the latest MBE research and applications in epitaxial growth, along with a detailed discussion and 'how to' on processing molecular or atomic beams that occur on the surface of a heated crystalline substrate in a vacuum. The techniques addressed in the book can be deployed wherever precise thin-film devices with enhanced and unique properties for computing, optics or photonics are required. It includes new semiconductor materials, new device structures that are commercially available, and many that are at the advanced research stage. This second edition covers the advances made by MBE, both in research and in the mass production of electronic and optoelectronic devices. Enhancements include new chapters on MBE growth of 2D materials, Si-Ge materials, AIN and GaN materials, and hybrid ferromagnet and semiconductor structures. - Condenses the fundamental science of MBE into a modern reference, speeding up literature review - Discusses new materials, novel applications and new device structures, grounding current commercial applications with modern understanding in industry and research - Includes coverage of MBE as mass production epitaxial technology and how it enhances processing efficiency and throughput for the semiconductor industry and nanostructured semiconductor materials research community
Author : Orlando Auciello
Publisher : John Wiley & Sons
Page : 282 pages
File Size : 30,45 MB
Release : 2001
Category : Science
ISBN : 9780471241416
An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application
Author : Jorg Fink
Publisher : World Scientific
Page : 564 pages
File Size : 20,20 MB
Release : 1994-10-31
Category :
ISBN : 9814550418
The proceedings summarise the oral and poster presentations of the Winterschool on the above topic. The event was the sixth in a series aimed at describing and discussing recent advances in the understanding of the electronic properties of novel materials. The topic of the meeting, fullerenes and related materials, was chosen as a sequel to that of the previous year in an effort to keep abreast of this new and rapidly evolving field of research. For the duration of the week, world experts from the fields of physics, chemistry and materials science were gathered together to present their current research as well as to participate in the many lively discussions which evolved from the presentations. As such, the proceedings constitute a definitive description of the state of the art of fullerene research.
Author : Tibor Braun
Publisher : World Scientific
Page : 536 pages
File Size : 41,2 MB
Release : 1997
Category : Science
ISBN : 9789810233457
The book is a follow-up to the computerized fullerene bibliography related to the 1985-1993 period. It is a well-indexed overview of the journal literature on a topic for which the 1996 Nobel Prize in Chemistry was awarded. It is an indispensable tool for any specialist interested in the literature of one of the most researched interdisciplinary topics in the sciences.
Author : D. Guldi
Publisher : The Electrochemical Society
Page : 23 pages
File Size : 50,44 MB
Release : 2010-02
Category : Science
ISBN : 1566777895
The papers included in this issue of ECS Transactions were originally presented in the symposium ¿Nanostructure and Function of Fullerenes¿, held during the 216th meeting of The Electrochemical Society, in Vienna, Austria from October 4 to 9, 2009.
Author :
Publisher :
Page : 1044 pages
File Size : 44,61 MB
Release : 1999
Category : Aeronautics
ISBN :
Author : Tibor Braun
Publisher : World Scientific
Page : 528 pages
File Size : 37,82 MB
Release : 1997-12-18
Category : Technology & Engineering
ISBN : 9814496596
The book is a follow-up to the computerized fullerene bibliography related to the 1985-1993 period. It is a well-indexed overview of the journal literature on a topic for which the 1996 Nobel Prize in Chemistry was awarded. It is an indispensable tool for any specialist interested in the literature of one of the most researched interdisciplinary topics in the sciences.
Author : F. Kajzar
Publisher : Springer Science & Business Media
Page : 555 pages
File Size : 34,86 MB
Release : 2012-12-06
Category : Science
ISBN : 9401140561
Proceedings of the NATO Advanced Research Workshop, Menton, France, 26-31 August, 1999
Author :
Publisher :
Page : 1556 pages
File Size : 14,94 MB
Release : 1992
Category : Aeronautics
ISBN :