IEEE Std P1578


Book Description




IEEE Std P525


Book Description







Essential Statistical Inference


Book Description

​This book is for students and researchers who have had a first year graduate level mathematical statistics course. It covers classical likelihood, Bayesian, and permutation inference; an introduction to basic asymptotic distribution theory; and modern topics like M-estimation, the jackknife, and the bootstrap. R code is woven throughout the text, and there are a large number of examples and problems. An important goal has been to make the topics accessible to a wide audience, with little overt reliance on measure theory. A typical semester course consists of Chapters 1-6 (likelihood-based estimation and testing, Bayesian inference, basic asymptotic results) plus selections from M-estimation and related testing and resampling methodology. Dennis Boos and Len Stefanski are professors in the Department of Statistics at North Carolina State. Their research has been eclectic, often with a robustness angle, although Stefanski is also known for research concentrated on measurement error, including a co-authored book on non-linear measurement error models. In recent years the authors have jointly worked on variable selection methods. ​




Essential Issues in SOC Design


Book Description

This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.







VLSI Test Principles and Architectures


Book Description

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.




Hybrid Learning and Education


Book Description

This book constitutes the refereed proceedings of the First International Conference on Hybrid Learning, ICHL 2008, held in Hong Kong, China, in August 2008. The 38 revised full papers presented together with 3 keynote lectures were carefully reviewed and selected from 142 submissions. The papers are organized in topical sections on hybrid education, model and pedagogies for hybrid learning, trends, pervasive learning, mobile and ubiquitous learning, hybrid learning experiences, hybrid learning systems, technologies, as well as contextual attitude and cultural effects.




Advances in Web Based Learning - ICWL 2007


Book Description

This book contributes the thoroughly refereed post-conference proceedings of the 6th International Conference on Web-Based Learning, ICWL 2007, held in Edinburgh, UK, in August 2007. The 55 revised full papers presented together with 1 keynote talk were carefully reviewed and selected from about 180 submissions. The papers are organized in topical sections on personalized e-learning, learning resource organization and management, framework and standards for e-learning, test authoring, question generation and assessment, language learning, science education, visualization technologies for content delivery and learning behavior, practice and experience sharing, security, privacy and mobile e-learning, as well as blended learning.